Far-IR spectroscopic ellipsometer

Barth, Karl; Böhme, D.; Kamarás, Katalin; Keilmann, F.; Cardona, M.

doi:10.1016/0040-6090(93)90276-u

Cited by 28 publications

(8 citation statements)

References 7 publications

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“…The measurements were partly performed with a homebuilt ellipsometer attached to a Bruker 113v Fourier transform IR spectrometer 11 and with the same ellipsometer attached to a Nicolet Impact 400 vacuum Fourier spectrometer at the beam line U4IR of the National Synchrotron Light Source ͑NSLS͒ in Brookhaven. 12 The ellipsometer is basically a rotating analyzer setup, where the polarization ellipse of the light after reflection on the sample is determined by monitoring for each frequency the detected intensity as a function of the analyzer angle A.…”

Section: Experimental Details Sample Preparation and Data Evalumentioning

confidence: 99%

Dynamics of thec-polarized infrared-active modes in La2−xSrx

et al. 1997

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We have studied the c-polarized optical phonons of high quality single crystals of La 2Ϫx Sr x CuO 4 with doping concentrations ranging from the underdoped to the overdoped regime (xϭ0.1,0.12,0.15,0.18,0.2) at temperatures between 10 and 300 K. We discuss the dependence of all observed phonon modes on temperature as well as on doping. We find no indication for a coupling of the zone-center phonons to the electronic continuum, either in the normal or in the superconducting state. ͓S0163-1829͑97͒08734-1͔

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Section: Experimental Details Sample Preparation and Data Evalumentioning

confidence: 99%

Dynamics of thec-polarized infrared-active modes in La2−xSrx

et al. 1997

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“…[37] to use this method of sequential stepping a continuous wave source or using a continuous, but broad band source and taking advantage of the frequency multiplexing afforded by Fourier Transform Infrared (FTIR) spectroscopy. Following work in the mid-infrared by Rösler et al [33] and others [34,35], Barth et al [39] constructed an FIR spectroscopic ellipsometer based on a commercial Bruker 113v FTIR instrument. The spectral range covered was 0.9 -18 THz.…”

Section: Far Infrared Ellipsometry Using Continuous Wave Sourcesmentioning

confidence: 99%

Developments in THz Range Ellipsometry

Neshat

Armitage

2013

J Infrared Milli Terahz Waves

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Ellipsometry is a technique whereby the measurement of the two orthogonal polarization components of light reflected at glancing incidence allows a characterization of the optical properties of a material at a particular frequency. Importantly, it obviates the need for measurement against a standard reference sample, and so can provide reliable spectroscopic information even when surface morphology is unknown, of marginal quality and/or a reference is unavailable. Although a standard technique in the visible range, it has not been widely applied in the Terahertz (THz) spectral range despite its potential utility. This is largely because of the technical difficulties that these frequencies present. This review details recent progress in the implementation of THz range ellipsometry. We discuss a variety of configurations including various kinds of laboratory and facility based sources using both continuous wave and pulsed spectroscopic methods. We discuss the general problems encountered when trying to import the methodologies of visible range ellipsometry to the THz range and give examples of where the technique has been successful thus far.

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“…The depleted layer results from the charge trapped at the surface; it is strongly influenced by oxidation and adsorption. 6 The measured quantity is the ratio of complex amplitude reflectivities r p and r s of the p-and s-polarized light, respectively, 3 The technique is intrinsically sensitive to the presence of thin films.…”

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confidence: 99%