Fast and Accurate Estimation of Statistical Eye Diagram for Nonlinear High-Speed Links

Chu, Xiuqin; Guo, Wenting; Wang, Jun; Wu, Feng; Luo, Yuhuan; Li, Yushan

doi:10.1109/tvlsi.2021.3082208

Cited by 11 publications

(2 citation statements)

References 20 publications

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“…The minimum required order should be explored and chosen for the efficient MER method [42]. A hybrid method combining the high-order, low-order MER, and DER methods has also been proposed [43], in which the convolution process in the statistical eye diagram is subdivided into nonlinear, transition, and linear sections.…”

Section: Nonlinearity Of Cmos Buffersmentioning

confidence: 99%

Statistical Eye Diagrams for High-Speed Interconnects of Packages: A Review

Park,

Kim

2024

IEEE Access

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An eye diagram, a critical metric in signal integrity analysis for high-speed interconnects such as packages, interposer, and printed circuit boards (PCBs), is generated by superposition of the received waveform. Obtaining an eye diagram is time-consuming, thus signal integrity analysis is inefficient. This article reviews that have been proposed to overcome this limitation. The statistical eye diagram provides a probability distribution depending on a sampling time and voltage, therefore it can be expanded to other metrics, such as the bit-error rate and shmoo plot. This article introduces previous research on statistical eye diagrams applied to complementary metal-oxide-semiconductors (CMOSs), noise, and high-speed systems. The methods applied to CMOSs include asymmetry between the P/NMOS transistors and the nonlinearity of the CMOS. The methods applied to noise include signal and power noise. The methods applied to high-speed systems include equalizers, signaling, encoding, linear feedback shift register, and error correction code.INDEX TERMS Complementary metal-oxide-semiconductor (CMOS), crosstalk, double edge response (DER), error correction code (ECC), encoding, equalizer, eye diagram, multiple edge response (MER), pulse amplitude modulation (PAM), package, single bit response (SBR), signal integrity (SI), statistical eye diagram.

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Section: Nonlinearity Of Cmos Buffersmentioning

confidence: 99%

Statistical Eye Diagrams for High-Speed Interconnects of Packages: A Review

Park,

Kim

2024

IEEE Access

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“…After the introduction of statistical approaches in SI [23], statistical eye diagrams were proposed [24]- [25]. Some statistical eye diagrams pertain to the system level [26]- [29], whereas others pertain to nonlinearity [30]- [33] and the power/ground noise [34]. The statistical eye diagram is defined according to probability and thus can be translated into a Bit-Error Rate (BER) eye diagram with an integral.…”

Section: Introductionmentioning

confidence: 99%