Fast Chemical Contrast by X-ray Fluorescence Intensity Ratio Detection

Abstract

We describe a protocol for efficient detection of the chemical state of an element based on X-ray emission (fluorescence) spectroscopy using a Bragg optics spectrometer. The ratio of intensities at two appropriately chosen X-ray emission energies is a self-normalized quantity largely free of experimental artifacts and can thus be recorded with high accuracy. As the X-ray fluorescence lines are chemically sensitive, the intensity ratio identifies the chemical state. Differences between chemical states in spatially inhomogeneous or temporally evolving samples can be identified already with low numbers of photon events. This reduces the time required for data acquisition by 2 orders of magnitude as compared to recording a full spectrum.