Fast diffraction-enhanced imaging using continuous sample rotation and analyzer crystal scanning

Yoneyama, Akio; Lwin, Thet Thet; Kawamoto, Masahide

doi:10.1107/s1600577519016795

Cited by 4 publications

(5 citation statements)

References 29 publications

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“…However, since the high-precision angular positioning of the analyzer crystal requires a long stabilization period, the measurement time becomes longer. Therefore, we developed a continuous scanning method in which the analyzer crystal is slowly scanned through the rocking curve while the sample is also rotated by 360 degrees to shorten the measurement time [14].…”

Section: Diffraction-enhanced Imagingmentioning

confidence: 99%

Four-type phase-contrast X-ray imaging at SAGA Light Source

Yoneyama

Baba

Lwin

et al. 2022

J. Phys.: Conf. Ser.

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Phase-contrast X-ray imaging (Phase imaging), which uses X-ray phase-shift caused by passing through a sample, is a powerful tool for non-destructive three-dimensional observation. Since the cross-section of the phase-shift for light elements in the hard X-ray region is more than 1,000 times larger than that of the absorption, detailed observation can be performed even for biological soft tissues and organic materials, mainly composed of light elements. Phase imaging for a large field of view can be classified into four kinds. The sensitivity and dynamic range of phase imaging are related to a trade-off: each method’s properties differ significantly. Therefore, an optimized phase imaging method needs to be selected for each sample’s density distribution. We have been developing all types of phase imaging for fine observations of various samples using the optimal phase imaging method at the SAGA Light Source. We report the details of each method and instrumentation and give example observations.

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Section: Diffraction-enhanced Imagingmentioning

confidence: 99%

Four-type phase-contrast X-ray imaging at SAGA Light Source

Yoneyama

Baba

Lwin

et al. 2022

J. Phys.: Conf. Ser.

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“…4 shows the SR spectra as a result of adding different metal filters in the beam path. The spectral data were obtained by -2 scanning of a Si single crystal by an X-ray diffractometer placed on the optical bench of the optical hutch [details of the measurements can be found in a previous report (Yoneyama & Kawamoto, 2020)]. This result shows that the peak energy can be shifted by changing the metal filter's type and thickness; in particular, it can be set to 15 keV by using 1 mm-thick aluminium and 30 keV by using 0.5 mm-thick copper.…”

Section: Sr Fluxmentioning

confidence: 99%

“…In particular, we have developed a fast phase-contrast CT system using diffraction-enhanced imaging. The system has been used to make 3D observations within a 10 min scanning time (Yoneyama et al, 2020). In addition, we have developed a scanning X-ray fluorescence microscopy (SXFM) system using total-reflection mirrors and white SR.…”

Section: Introductionmentioning

confidence: 99%

“…In addition, we have developed a scanning X-ray fluorescence microscopy (SXFM) system using total-reflection mirrors and white SR. This system has been used to map the distributions of elements such as S, Cl, K and Ca in plant seeds (Yoneyama & Kawamoto, 2020). We have also developed high-resolution lens-coupled X-ray imagers using optimized phosphor (Yoneyama et al, 2021).…”

Section: Introductionmentioning

confidence: 99%

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Advanced X-ray imaging at beamline 07 of the SAGA Light Source

Yoneyama¹,

Takeya²,

Lwin³

et al. 2021

J Synchrotron Radiat

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The SAGA Light Source provides X-ray imaging resources based on high-intensity synchrotron radiation (SR) emitted from the superconducting wiggler at beamline 07 (BL07). By combining quasi-monochromatic SR obtained by the newly installed water-cooled metal filter and monochromatic SR selected by a Ge double-crystal monochromator (DCM) with high-resolution lens-coupled X-ray imagers, fast and low-dose micro-computed tomography (CT), fast phase-contrast CT using grating-based X-ray interferometry, and 2D micro-X-ray absorption fine structure analysis can be performed. In addition, by combining monochromatic SR obtained by a Si DCM with large-area fiber-coupled X-ray imagers, high-sensitivity phase-contrast CT using crystal-based X-ray interferometry can be performed. Low-temperature CT can be performed using the newly installed cryogenic system, and time-resolved analysis of the crystallinity of semiconductor devices in operation can be performed using a time-resolved topography system. The details of each instrument and imaging method, together with exemplary measurements, are presented.

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“…[31] Previous studies demonstrated that precise angular positioning of the analyzer crystal within sub-arcseconds was indispensable for the precise detection of phase shifts. [33] However, external vibrations of experimental environments, as well as mechanical imprecisions of system components, e.g., the precision of motor, can induce deviations of analyzer angular positions, and hence errors in the acquired raw data.…”

Section: Introductionmentioning

confidence: 99%

Analysis of refraction and scattering image artefacts in x-ray analyzer-based imaging

Zhao¹,

Wang²,

Ma³

et al. 2023

Chinese Phys. B

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X-ray analyzer-based imaging (ABI) is a powerful phase-sensitive technique that can provide a wide dynamic range of density and extract useful physical properties of the sample. It derives contrast from X-ray absorption, refraction, and scattering properties of the investigated sample. However, X-ray ABI setups can be susceptible to external vibrations, and mechanical imprecisions of system components, e.g. the precision of motor, which are unavoidable in practical experiments. Those factors will provoke deviations of analyzer angular positions and hence errors in the acquired image data. Consequently, those errors will introduce artefacts in the retrieved refraction and scattering images. These artefacts are disadvantageous for further image interpretation and tomographic reconstruction. For this purpose, this work aims to analyze image artefacts resulting from deviations of analyzer angular positions. Analytical expressions of the refraction and scattering image artefacts were derived theoretically and validated by synchrotron radiation experiments. The results showed that for the refraction image, the artefact was independent of the sample’s absorption and scattering signals. By contrast, artefact of the scattering image was dependent on both the sample’s refraction and scattering signals, but not on absorption signal. Furthermore, the effect of deviations of analyzer angular positions on the accuracy of the retrieved images was investigated, which can be of use for optimization of data acquisition. This work offers the possibility to develop advanced multi-contrast image retrieval algorithms that suppress artefacts in the retrieved refraction and scattering images in X-ray analyzer-based imaging.

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Fast diffraction-enhanced imaging using continuous sample rotation and analyzer crystal scanning

Cited by 4 publications

References 29 publications

Four-type phase-contrast X-ray imaging at SAGA Light Source

Four-type phase-contrast X-ray imaging at SAGA Light Source

Advanced X-ray imaging at beamline 07 of the SAGA Light Source

Analysis of refraction and scattering image artefacts in x-ray analyzer-based imaging

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