Fast Enhancement of Validation Test Sets to Improve Stuck-at Fault Coverage for RTL circuits

Lingappan, Loganathan; Gangaram, Vijay; Jha, Niraj K.; Chakravarty, S.

doi:10.1109/vlsid.2007.82

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Control And/or Datapath Oriented Rtl Fault Models1

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2016

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“…Lingappan et al also enhance the ADD based test generation technique by control-data flow graphs (CDFG) and state transition sequence analysis in [21,22]. Further on, the technique is enhanced by Boolean implications (also known as as the unsatisfiable segment) in [23,24].…”

Section: Control And/or Datapath Oriented Rtl Fault Modelsmentioning

confidence: 99%

A Novel RTL ATPG Model Based on Gate Inherent Faults (GIF-PO) of Complex Gates

Strauch¹

2016

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This paper starts with a comprehensive survey on RTL ATPG. It then proposes a novel RTL ATPG model based on "Gate Inherent Faults" (GIF). These GIF are extracted from each complex gate (adder, case-statement, etc.) of the RTL source code individually. They are related to the internal logic paths of a complex gate. They are not related to any net/signal in the RTL design. It is observed, that when all GIF on RTL are covered (100%) and the same stimulus is applied, then all gate level stuck-at faults of the netlist are covered (100%) as well. The proposed RTL ATPG model is therefore synthesis independent. This is shown on ITC'99 testcases. The applied semi-automatic test pattern generation process is based on functional simulation.

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Section: Control And/or Datapath Oriented Rtl Fault Modelsmentioning

confidence: 99%

A Novel RTL ATPG Model Based on Gate Inherent Faults (GIF-PO) of Complex Gates

Strauch¹

2016

Preprint

View full text Add to dashboard Cite

show abstract

Fast Enhancement of Validation Test Sets to Improve Stuck-at Fault Coverage for RTL circuits

Cited by 1 publication

References 17 publications

A Novel RTL ATPG Model Based on Gate Inherent Faults (GIF-PO) of Complex Gates

A Novel RTL ATPG Model Based on Gate Inherent Faults (GIF-PO) of Complex Gates

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