Fast Evaluation of RF Power Spectrum of Photodetectors With Windowing Functions

Abstract

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Study of an MoS2 Phototransistor Using a Compact Numerical Method Enabling Detailed Analysis of 2D Material Phototransistors

“…To our knowledge, our work is the first to calculate the phase noise of a 2D-material-based phototransistor. The phase noise varies between −112 dBc/Hz and −99 dBc/Hz, which is 70 dBc/Hz higher than state-of-the-art photodetectors 33,34 . One might try to lower the phase noise by placing metal nanoparticles near the 2D material.…”

Enhancing the Resolution of Local Near-Field Probing Measurements With Machine Learning

“…For our numerical study, we selected photodetectors [12], [13], [14], [15] as the device under investigation. By solving the drift-diffusion equations [12] on nonuniform spatial and temporal meshes [13], using monochromatic or broadband excitations [14], we can accurately and efficiently calculate both the field and current distributions along the photodetector. Particularly, with the nonuniform time-stepping capability, we can analyze thousands of photodetectors in a few hours using regular personal computers [14], [15].…”

“…By solving the drift-diffusion equations [12] on nonuniform spatial and temporal meshes [13], using monochromatic or broadband excitations [14], we can accurately and efficiently calculate both the field and current distributions along the photodetector. Particularly, with the nonuniform time-stepping capability, we can analyze thousands of photodetectors in a few hours using regular personal computers [14], [15].…”

“…The number of layers is 16. The material and doping types are assumed to be the same as those used in [14]. The beam and photodetector diameters are 28 µm.…”

“…Other than some peaks occurring at the interfaces, the field strength is typically high only in the intrinsic (i) region. We calculate the electric field profiles with the aforementioned drift-diffusion equations solver [12], [13], [14], [15]. Throughout this work, we will refer to these field profiles as the "true" field profiles.…”