Synthetic
talc is a new filler of industrial interest due to its
submicron size, its chemical and mineral purity, and its hydrophilic
character. To develop this filler on a preindustrial scale, this work
aimed to understand the mechanisms of transformation from the amorphous
talc precursor to crystalline synthetic talc. X-ray diffraction, Fourier
transform infrared spectroscopy, and extended X-ray absorption fine
structure at Ni–K edge techniques were used to study a Ni-talc
series composed of a talc precursor sample and talc samples synthesized
at 100, 200, and 300 °C for 1 or 6 h. As soon as the Ni-talc
precursor precipitated, a tetrahedral–octahedral–tetrahedral-type
structure appeared that was characterized by 2–3 Ni-octahedra
distanced 3.07 Å from each other and by 3–4 Si tetrahedra
distributed on the top and bottom of the octahedral “sheet”
and distanced 3.29 Å from Ni. Simultaneously following the synthesis
temperature, the octahedral sheet grew, and the tetrahedral sheet
expanded; the distances Ni–Ni and Ni–Si also gradually
shortened. The intracrystalline distribution of the octahedral sheet
was also studied. At 300 °C, a random distribution was obtained.
Cluster distribution was not observed at low temperature, which we
hypothesize is a function of crystallite size.