Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy

Garrett, Joseph L.; Munday, Jeremy N.

doi:10.1088/0957-4484/27/24/245705

Cited by 66 publications

(95 citation statements)

References 67 publications

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“…While we focused in Sec. VI on analyzing light-induced changes to the sample impedance, the model could also accommodate light-induced changes to the surface potential Φ or describe how the sample impedance would impact novel Kelvin probe force microscopy measurements such as heterodyne KPFM [83,84], dissipative KPFM [85,86], or open-loop KPFM [87,88] which seek to combine the spatial resolution of forcegradient measurements with the temporal resolution of force measurements. Our approach reveals how the signal in these experiments changes when the sample impedance becomes significant.…”

Section: Discussionmentioning

confidence: 99%

Lagrangian and Impedance-Spectroscopy Treatments of Electric Force Microscopy

2019

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Scanning probe microscopy is often extended beyond simple topographic imaging to study electrical forces and sample properties, with the most widely used experiment being frequency-modulated Kelvin probe force microscopy. The equations commonly used to interpret this frequency-modulated experiment, however, rely on two hidden assumptions. The first assumption is that the tip charge oscillates in phase with the cantilever motion to keep the tip voltage constant. The second assumption is that any changes in the tip-sample interaction happen slowly. Starting from an electro-mechanical model of the cantilever-sample interaction, we use Lagrangian mechanics to derive coupled equations of motion for the cantilever position and charge. We solve these equations analytically using perturbation theory, and, for verification, numerically. This general approach rigorously describes scanned probe experiments even in the case when the usual assumptions of fast tip charging and slowly changing samples properties are violated. We develop a Magnus-expansion approximation to illustrate how abrupt changes in the tip-sample interaction cause abrupt changes in the cantilever amplitude and phase. We show that feedback-free time-resolved electric force microscopy cannot uniquely determine sub-cycle photocapacitance dynamics. We then use first-order perturbation theory to relate cantilever frequency shift and dissipation to the sample impedance even when the tip charge oscillates out of phase with the cantilever motion. Analogous to the treatment of impedance spectroscopy in electrochemistry, we apply this approximation to determine the cantilever frequency shift and dissipation for an arbitrary sample impedance in both local dielectric spectroscopy and broadband local dielectric spectroscopy experiments. The general approaches we develop provide a path forward for rigorously modeling the coupled motion of the cantilever position and charge in the wide range of electrical scanned probe microscopy experiments where the hidden assumptions of the conventional equations are violated or inapplicable. arXiv:1807.01219v2 [cond-mat.mes-hall]

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Section: Discussionmentioning

confidence: 99%

Lagrangian and Impedance-Spectroscopy Treatments of Electric Force Microscopy

2019

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“…350 For example, H-KPFM improved the scan rate while maintaining the spatial resolution and voltage sensitivity comparable to FM-KPFM. 59 Furthermore, it is not susceptible to artifacts such as stray capacitance (AM mode), topographical oscillation (FM mode) and AC inductive coupling (AM mode) artifacts. 59,346 However, artifacts originating from collisions with the surface persist.…”

Section: Combination Of Afm With Kelvin Methods -Kelvin Probe Force MImentioning

confidence: 99%

“…These effects can either be enhancement 53,54 or quenching 55,56 of uorescence, leading to a change in the excited state lifetime 57 and can be utilized to enhance the spatial resolution of the CLSM/FLIM (uorescence lifetime imaging microscopy). 58 Tremendous effort is concentrated on the implementation of non-optical methods, such as Kelvin probe 59 or thermal microscopy 50 into the AFM. These combined methods allow concomitant measurement of topography with a localized surface potential, 60 thermal information 61 or thermal conductivity, 50 which is important for material science and engineering, for example, mapping of semiconductors and their work functions.…”

Section: Introductionmentioning

confidence: 99%

Recent advances in hybrid measurement methods based on atomic force microscopy and surface sensitive measurement techniques

2017

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“…The small contribution from the beam validates the approximation that the electrostatic force acts on the tip apex for sideband actuation of higher eigenmodes. In the small-oscillation approximation 22,24 , the force driving sideband oscillation is F side cos(ω D t), where…”

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confidence: 99%

Effect of lateral tip motion on multifrequency atomic force microscopy

Garrett

Krayer

Palm

et al. 2017

Applied Physics Letters

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In atomic force microscopy (AFM), the angle relative to the vertical ($\theta_{i}$) that the tip apex of a cantilever moves is determined by the tilt of the probe holder and the geometries of the cantilever and actuated eigenmode $i$. Even though the effects of $\theta_{i}$ on static and single-frequency AFM are known (increased effective spring constant, sensitivity to sample anisotropy, etc), the higher eigenmodes used in multifrequency force microscopy lead to additional effects that have not been fully explored. Here we use Kelvin probe force microscopy (KPFM) to investigate how $\theta_{i}$ affects not only the signal amplitude and phase, but can also lead to behaviors such as destabilization of the KPFM voltage feedback loop. We find that longer cantilevers and modified sample orientations improve voltage feedback loop stability, even though variations to scanning parameters such as cantilever shake amplitude and lift height do not.Comment: 5 pages of text, 5 figures. Revision replaces discussion of bimodal AFM with more discussion of experimental result

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Fast, high-resolution surface potential measurements in air with heterodyne Kelvin probe force microscopy

Cited by 66 publications

References 67 publications

Lagrangian and Impedance-Spectroscopy Treatments of Electric Force Microscopy

Lagrangian and Impedance-Spectroscopy Treatments of Electric Force Microscopy

Recent advances in hybrid measurement methods based on atomic force microscopy and surface sensitive measurement techniques

Effect of lateral tip motion on multifrequency atomic force microscopy

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