Fast Jitter Test Solutions of High-Speed IO Based on Timing and Frequency Domain

Abstract

To quantify the transmission quality of HSIO with high-level confidence is the big challenge in front of SOC ATE test engineers. The mainstream approaches can be separated into 3 types: BIST loopback, golden device and fast eye-mask test. All these 3 approaches cannot meet the strict specifications of the leading-edge high-speed device which need random jitter and deterministic jitter separation. This paper introduces one fast jitter test solution which can get accurate RJ/DJ value from either timing domain or frequency domain. This solution has been implemented in production of real devices and the result shows its high accuracy.