“…However, in complementary metal-oxide semiconductor (CMOS) technologies, the absolute value of resistance and capacitance is greatly affected by process and temperature. As a result, RC time constant uncertainty of up to 50% could occur due to variations in process, voltage, and temperature (PVT); this uncertainty will reduce the frequency performance of filters, leading to reliability issues in integrated circuits [ 5 , 6 , 7 , 8 , 9 , 10 ]. Accordingly, many real-time on-chip automatic tuning methods have been proposed and developed to improve the accuracy in the calibration of the RC time constant [ 2 , 6 , 11 , 12 , 13 , 14 , 15 ].…”