Major progress in FFT impedance spectroscopy now allows in‐situ measurements during pore growth in three modes, two of which use modulation of the back side or front side illumination intensity, respectively; with the back side illumination mode being especially useful to n‐macro(bsi) pores in Silicon. The data obtained in all modes can be interpreted on the base of fully quantitative models which give perfect fits to the measured data and therefore allow to extract in‐situ data of many parameters, including the valence of the process and the actual pore depth. Based on this, macropore growth in Si has been re‐investigated, resulting in new growth modes and especially in substantially increased macropore growth rates as well as pore quality. It is now possible to grow macropores in n‐type Si far deeper and more than twice as fast compared to the present state of the art; the quality as expressed, e.g., in the pore wall roughness, can also be substantially improved. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)