Fast mode surface plasmon damping on tunnel junction structures

Connolly, Melissa; Ferguson, Andrew J.; Dawson, Paul; Tamm, I.R.; Walmsley, D.G.

doi:10.1016/0039-6028(91)90481-7

Cited by 6 publications

(3 citation statements)

References 26 publications

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“…The factor which differs between the centre and edges of the junction area is the thickness of the underlying Al layer. The fields of the SPP at the Ag-air interface penetrate into the Al base 6 M is a 'lossy' metal at wavelengths in the visible region of the spectrum. Near the centre of the junction area the underlying Al is thicker than beyond the geometrical edges and this may result in greater damping of the SPP fields, and consequently less light output, in the central region.…”

Section: Resultsmentioning

confidence: 99%

<title>Influence of surface topography on light emission from tunnel junctions</title>

et al. 1992

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Visible light is emitted from roughened metal-oxide-metal tunnel junctions subjected to a small (2 -4 V) dc bias. The colour of the emitted light is voltage tunable but device quantum efficiency is generally very low (105 -107). The optical emission is due to the roughness induced scattering of electronically excited surface plasmon polaritons. The characteristics of the surface roughness are clearly important in determining the overall device efficiency and spectral output. With a view to better understanding and improving the efficiency we have examined the surface topography of variously roughened devices and relate this to the optical output. For example, we have roughened devices by means of holographic crossed diffraction grating substrates which possess surface topography of greater rms roughness height and larger transverse correlation length than that of devices roughened by a pre-deposited CaF2 layer. Devices roughened by means of a particulate aluminium substrate are also discussed.

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Section: Resultsmentioning

confidence: 99%

<title>Influence of surface topography on light emission from tunnel junctions</title>

et al. 1992

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“…Values for the film thickness were obtained by matching computer modelled reflectance curves [20] with the corresponding experimental curves . Integrated ppolarized relative intensities of the scattered light were determined by measuring the areas under the angular distribution curves .…”

Section: Methodsmentioning

confidence: 99%

“…Not all irreproducibility is eliminated but a consistent interpretation becomes possible . Topographic information from scanning tunnelling microscopy [18,19] and improved theoretical modelling [20] of films and multilayers have helped to support the argument :…”

Section: Introductionmentioning

confidence: 92%