Introduction. Computer-aided design systems for microwave devices are an effective tool for assessing the backscattering characteristics of complex-shaped objects. However, these calculations are often associated with significant computational costs, especially at large values of the ratio of the characteristic dimensions of the object to the wavelength. The use of asymptotic methods in combination with the mesh coarsening of object partition can significantly reduce these costs. However, in each practical case, this leads to a deterioration in the accuracy of the estimates obtained, which is hard to predict.Aim. Comparative assessment of the results of modeling the scattering field in the CAD of microwave devices using various methods for calculating and detailing the object model in the decimeter and centimeter wavelength ranges.Materials and methods. The research object was an anti-tank guided missile FGM-148 Javelin. The scattering field of Altair FEKO microwave devices was modeled in CAD using the methods of moments and physical optics in the frequency range from 1 to 10 GHz and angles from 0 to 180°. A comparison of one-dimensional backscatter diagrams and radar images obtained using these methods was carried out.Results. For the class of objects under consideration, the method of physical optics provides acceptable accuracy at frequencies of 5 GHz and higher with a step of partitioning the model surface of the order of one centimeter and a total calculation duration of the order of several minutes (Intel Core i5-4460 PC / 3.2 GHz / 8 MB RAM). At lower frequencies, acceptable accuracy and a similar calculation duration are achieved when calculating by the method of moments and a partitioning step of about 20 cm. The possibility of using the Altair FEKO CAD system for modeling radar images of objects with a resolution of at least 20 cm is demonstrated.Conclusion. The results obtained complement the well-known studies in the field of comparative assessment of the time and accuracy characteristics of various methods for calculating the scattering field of objects in the CAD of microwave devices.
