2007
DOI: 10.1016/j.jelechem.2007.02.023
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Fast-scan cyclic voltammetry–scanning electrochemical microscopy

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Cited by 25 publications
(31 citation statements)
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“…These may be deconvoluted using a method that determines the tip-substrate distance, which can be used as a feedback mechanism for distance control during imaging of a substrate (vide infra). There are many modes of SECM, such as the feedback mode discussed [20], generation collection modes [21], redox competition mode [22], surface interrogation mode [23], direct mode [24], potentiometric mode [25], and fast-scan cyclic voltammetry (FSCV) mode [26]. The advantages and applications of these and other modes are described elsewhere and are not the focus of the present manuscript.…”
Section: Scanning Electrochemical Microscopymentioning
confidence: 99%
“…These may be deconvoluted using a method that determines the tip-substrate distance, which can be used as a feedback mechanism for distance control during imaging of a substrate (vide infra). There are many modes of SECM, such as the feedback mode discussed [20], generation collection modes [21], redox competition mode [22], surface interrogation mode [23], direct mode [24], potentiometric mode [25], and fast-scan cyclic voltammetry (FSCV) mode [26]. The advantages and applications of these and other modes are described elsewhere and are not the focus of the present manuscript.…”
Section: Scanning Electrochemical Microscopymentioning
confidence: 99%
“…A new routine in SECMx ('4D-Experiment') was used to measure a single cyclic voltammogram (CV) of the sample after each translation step while the x-and y-motors were resting. [26][27][28][29] The CVs were performed after a quite time of 2 s between 0.8 V and 0.1 V at a scan rate v = 0.2 V/s. During the execution of the CVs, the ME potential E T was held at 0.4 V vs. RHE and the resulting currents at the ME (i T ) and the substrate (i S ) were recorded.…”
Section: F874mentioning
confidence: 99%
“…Recently, Wipf, Baur and colleagues combined FSCV with SECM, which provided important advantages over SECM used alone (9193). In summary, cyclic voltammetry was carried out at the SECM tip at rapid scan rates (10–1000 V s −1 ); 3D data sets were produced for line scans and 4D data sets were produced for imaging experiments.…”
Section: Scanning Electrochemical Microscopymentioning
confidence: 99%