Fast Short Circuit Type I Detection Method based on VGE-Monitoring

Abstract

In this paper, a Short Circuit type I detection method based on the monitoring of the gate voltage is investigated. The proposed detection principle relies on an existing method, which was realized as an integrated solution before. A modified discrete circuit solution is introduced, developed and tested. Moreover, measurements and investigations on different packaging concepts and test conditions are performed. The overview of the functionality, reliability, and restraints of this method, as well as aspects of a supposed dynamic self-adaption feature, are discussed.