FAST-XPD: XFEL photon pulses database for modeling XFEL experiments

Manetti, Maurizio; Buzmakov, A. V.; Samoylova, Liubov; Schneidmiller, E.A.; Sinn, H.; Szuba, J.; Wrona, K.; Yurkov, M.V.

doi:10.1063/1.5084582

Cited by 2 publications

(2 citation statements)

References 17 publications

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“…Here we compare the output of wavefront propagation simulations using a phenomenological representation of the XFEL source with those obtained using wavefields from the FAST X-ray Pulse Database (Manetti et al, 2019). Our goal is to demonstrate the effectiveness of our model by accurately reproducing the radiation statistics observed at the European XFEL, both on single-shot and on shot-to-shot timescales.…”

Section: Simulations and Resultsmentioning

confidence: 99%

A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser

Guest,

Bean,

Kammering

et al. 2023

Int Union Crystallogr J

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Many coherent imaging applications that utilize ultrafast X-ray free-electron laser (XFEL) radiation pulses are highly sensitive to fluctuations in the shot-to-shot statistical properties of the source. Understanding and modelling these fluctuations are key to successful experiment planning and necessary to maximize the potential of XFEL facilities. Current models of XFEL radiation and their shot-to-shot statistics are based on theoretical descriptions of the source and are limited in their ability to capture the shot-to-shot intensity fluctuations observed experimentally. The lack of accurate temporal statistics in simulations that utilize these models is a significant barrier to optimizing and interpreting data from XFEL coherent diffraction experiments. Presented here is a phenomenological model of XFEL radiation that is capable of capturing the shot-to-shot statistics observed experimentally using a simple time-dependent approximation of the pulse wavefront. The model is applied to reproduce non-stationary shot-to-shot intensity fluctuations observed at the European XFEL, whilst accurately representing the single-shot properties predicted by FEL theory. Compared with previous models, this approach provides a simple, robust and computationally inexpensive method of generating statistical representations of XFEL radiation.

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Section: Simulations and Resultsmentioning

confidence: 99%

A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser

Guest,

Bean,

Kammering

et al. 2023

Int Union Crystallogr J

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“…The spectra in the self-amplified spontaneous emission (SASE) mode of the European XFEL have been generated with the simulation code FAST (Saldin et al, 1999), which provides a 2D distribution of electric field in real space at the exit of the undulator for each moment of time for various parameters of the electron bunch charge and the undulator. Simulation results are stored in an in-house database (Manetti et al, 2015). The spectra are simulated for the electron energy 14 GeV, photon energy 12.4 keV, and the active undulator length corresponding to the saturation length, the point with the maximum brightness, for a given electron bunch charge (Schneidmiller & Yurkov, 2014).…”

Section: Spectra Of Xfel Pulsesmentioning

confidence: 99%

X-ray diffraction from strongly bent crystals and spectroscopy of X-ray free-electron laser pulses

2020

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The use of strongly bent crystals in spectrometers for pulses of a hard x-ray freeelectron laser is explored theoretically. Diffraction is calculated in both dynamical and kinematical theories. It is shown that diffraction can be treated kinematically when the bending radius is small compared to the critical radius given by the ratio of the Bragg-case extinction length for the actual reflection to the Darwin width of this reflection. As a result, the spectral resolution is limited by the crystal thickness, rather than the extinction length, and can become better than the resolution of a planar dynamically diffracting crystal. As an example, we demonstrate that spectra of the 12 keV pulses can be resolved in 440 reflection from a 20 µm thick diamond crystal bent to a radius of 10 cm.

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FAST-XPD: XFEL photon pulses database for modeling XFEL experiments

Cited by 2 publications

References 17 publications

A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser

A phenomenological model of the X-ray pulse statistics of a high-repetition-rate X-ray free-electron laser

X-ray diffraction from strongly bent crystals and spectroscopy of X-ray free-electron laser pulses

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