2008
DOI: 10.1016/j.jprocont.2007.08.003
|View full text |Cite
|
Sign up to set email alerts
|

Fault detection and identification with a new feature selection based on mutual information

Abstract: International audienceThis paper presents a fault diagnosis procedure based on discriminant analysis and mutual information. In order to obtain good classification performances, a selection of important features is done with a new developed algorithm based on the mutual information between variables. The application of the new fault diagnosis procedure on a benchmark problem, the Tennessee Eastman Process, shows better results than other well known published methods

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
78
0

Year Published

2008
2008
2021
2021

Publication Types

Select...
8
1

Relationship

1
8

Authors

Journals

citations
Cited by 143 publications
(78 citation statements)
references
References 51 publications
0
78
0
Order By: Relevance
“…[22][23][24][25][26][27][28] Meanwhile, machine learning techniques, e.g., discriminant analysis (DA), neural network (NN), expert systems, support vector machines (SVM), Bayesian belief network (BBN), and mutual information, have been explored to address the complex process monitoring problems with some success. [29][30][31][32][33][34][35][36] Despite a rich body of literature in chemical process monitoring, most of the MSPM approaches rely on the assumption that the normal process data come from a single operating region and follow a unimodal distribution. The popular PCA/ PLS methods, for example, require the operating data to obey unimodal Gaussian distribution approximately so as to guarantee the valid T 2 and SPE control limits.…”
Section: Introductionmentioning
confidence: 99%
“…[22][23][24][25][26][27][28] Meanwhile, machine learning techniques, e.g., discriminant analysis (DA), neural network (NN), expert systems, support vector machines (SVM), Bayesian belief network (BBN), and mutual information, have been explored to address the complex process monitoring problems with some success. [29][30][31][32][33][34][35][36] Despite a rich body of literature in chemical process monitoring, most of the MSPM approaches rely on the assumption that the normal process data come from a single operating region and follow a unimodal distribution. The popular PCA/ PLS methods, for example, require the operating data to obey unimodal Gaussian distribution approximately so as to guarantee the valid T 2 and SPE control limits.…”
Section: Introductionmentioning
confidence: 99%
“…It is well-known that keeping non-informative descriptors in the model increases the classification error rate of new observations. The final goal when using a classifier is to obtain the lowest classification error of observations which did not participate to the construction of discriminant functions with the smallest number of descriptors [25].…”
Section: -P4mentioning
confidence: 99%
“…For example, given a learning sample of a bivariate system with three different known faults as illustrated in the figure 5, we can easily use supervised classification to classify a new faulty observation. A feature selection can be used in order to select only the most informative variables of the problem (Verron et al (2008)). In this study, we will use the Bayesian network as a supervised classification tool.…”
Section: Bayesian Network For Fault Diagnosismentioning
confidence: 99%