Abstract:This paper describes the application of model-based principal component analysis (MBPCA) to the identification and isolation of faults in CMOS manufacture. Some of the CMOS fabrication processing steps are well understood, with first principles mathematical models available, which can describe the physical and chemical phenomena that take place. The fabrication of the device using a known industrial process is therefore first modeled "ideally," using ATHENA and MATLAB. Detailed furnace models are used to inves… Show more
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