“…Reflectometry is a nondestructive technique to remotely detect, locate, and characterize useful information in physical systems. It has been used extensively in electrical systems to locate electrical “opens” or “shorts” [ 1 , 2 , 3 , 4 , 5 , 6 ], locate cable insulation break down [ 7 ], detect electrical system degradation [ 8 , 9 , 10 , 11 ], locate ground and arc faults [ 11 , 12 , 13 , 14 ], locate damaged components in photovoltaic (PV) systems [ 12 , 15 , 16 , 17 , 18 ], remotely measure complex impedance [ 17 , 19 , 20 , 21 , 22 ], locate intermittent faults that only occur during normal operation [ 3 , 4 , 8 , 23 , 24 , 25 , 26 ], and locate faults in three phase systems [ 27 ]. In material science, reflectometry has been used to characterize nanostructures, optical fiber networks, waveguides, and dielectrics [ 28 , 29 , 30 , 31 ].…”