2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS) 2013
DOI: 10.1109/dft.2013.6653586
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Fault Injection Framework for embedded memories

Abstract: Due to scalability issues of existing semiconductor memories emerging non-volatile memory technologies are gaining increasing interest. Their promising features like non-volatility, low-power consumption, and great scalability are expected to meet demands of upcoming digital systems. Unfortunately, due to their characteristics they often require special management. Moreover, due to certain properties, e.g. like limited endurance, their applicability in some cases can be restricted. As a result, selection of a … Show more

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