Fault isolation of digital scan logic without ‘scan diagnosis’

Yeoh, B.L.; Goh, S.H.; You, G.F.; Hu, Hao; Tan, Alan; Chan, Yi‐Hsin; Zhao, Lin; Lam, Jeffrey

doi:10.1109/ipfa.2017.8060124

2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) 2017

DOI: 10.1109/ipfa.2017.8060124

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Fault isolation of digital scan logic without ‘scan diagnosis’

B.L. Yeoh

S.H. Goh

G.F. You

et al.

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Fault isolation of digital scan logic without ‘scan diagnosis’

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References 9 publications

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