2023 38th IEEE/ACM International Conference on Automated Software Engineering (ASE) 2023
DOI: 10.1109/ase56229.2023.00147
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Fault Localization for Buggy Deep Learning Framework Conversions in Image Recognition

Nikolaos Louloudakis,
Perry Gibson,
José Cano
et al.

Abstract: When deploying Deep Neural Networks (DNNs), developers often convert models from one deep learning framework to another (e.g., TensorFlow to PyTorch). However, this process is error-prone and can impact target model accuracy.To identify the extent of such impact, we perform and briefly present a differential analysis against three DNNs widely used for image recognition (MobileNetV2, ResNet101, and InceptionV3) converted across four well-known deep learning frameworks (PyTorch, Keras, TensorFlow (TF), and TFLit… Show more

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