Fault Simulation and Emulation Tools to Augment Radiation-Hardness Assurance Testing

Quinn, Heather; Black, Dolores A.; Robinson, William H.; Buchner, S.

doi:10.1109/tns.2013.2259503

Cited by 76 publications

(28 citation statements)

References 136 publications

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“…To obtain the global error rate, we used the AMUSE tool [37], which is an evolved version of the NETFI tool [36]. In relation to test coverage, as described in [38], AMUSE typically provides 100% coverage of expected radiation test results with respect to fault locations, input vectors and clock cycles of operation for small or medium-size test cases. On the other hand, fault injection allows us to perform a more detailed analysis of the hardening approaches.…”

Section: Resultsmentioning

confidence: 99%

Efficient Mitigation of Data and Control Flow Errors in Microprocessors

Parra

Lindoso

Portela

et al. 2014

IEEE Trans. Nucl. Sci.

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Abstract-The use of microprocessor-based systems is gaining importance in application domains where safety is a must. For this reason, there is a growing concern about the mitigation of SEU and SET effects. This paper presents a new hybrid technique aimed to protect both the data and the control-flow of embedded applications running on microprocessors. On one hand, the approach is based on software redundancy techniques for correcting errors produced in the data. On the other hand, control-flow errors can be detected by reusing the on-chip debug interface, existing in most modern microprocessors. Experimental results show an important increase in the system reliability even superior to two orders of magnitude, in terms of mitigation of both SEUs and SETs. Furthermore, the overheads incurred by our technique can be perfectly assumable in low-cost systems.

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Section: Resultsmentioning

confidence: 99%

Efficient Mitigation of Data and Control Flow Errors in Microprocessors

Parra

Lindoso

Portela

et al. 2014

IEEE Trans. Nucl. Sci.

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“…This motivates that purely fault-injection experiments have to be carried out in this case. As indicated in [34], the test space for any fault-injection experiment comprises three axes: a) the number of fault locations, b) the number of test vectors and c) the number of program cycles of operation. However, even for small circuits, exhaustive fault-injection experiments may involve a combinatorial explosion of test cases that cannot be managed with an average computer.…”

Section: A Statistical Validationmentioning

confidence: 99%

A Methodology to Emulate Single Event Upsets in Flip-Flops Using FPGAs through Partial Reconfiguration and Instrumentation

Serrano

Clemente

Mecha

2015

IEEE Trans. Nucl. Sci.

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Abstract-This paper presents a methodology to emulate Single Event Upsets (SEUs) in FPGA flip-flops (FFs). Since the content of a FF is not modifiable through the FPGA configuration memory bits, a dedicated design is required for fault injection in the FFs. The method proposed in this paper is a hybrid approach that combines FPGA partial reconfiguration and extra logic added to the circuit under test, without modifying its operation. This approach has been integrated into a fault-injection platform, named NESSY (Non intrusive ErrorS injection SYstem), developed by our research group. Finally, this paper includes results on a Virtex-5 FPGA demonstrating the validity of the method on the ITC'99 benchmark set and a Feed-Forward Equalization (FFE) filter. In comparison with other approaches in the literature, this methodology reduces the resource consumption introduced to carry out the fault injection in FFs, at the cost of adding very little time overhead (1.6 µs per fault).

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“…This approach is very precise but could be excessively complicated an d expensive; a nd ( 2) s imulation with a nalysis: which u ses lo gic r elationships o f th e c ircuits a nd systems to access i nternal el ements a nd i nsert t he ef fect o f a r adiation induced f ault a ccording to th e f ault model. H owever, a limitation o f t his a pproach is th at it i s d ifficult t o a ssess t he radiation-tolerance o f t he whole s ystem [ 1]. To ad dress these issues, a new approach by co mbining the radiation protection and the rad-hardened design is developed.…”

Section: Introductionmentioning

confidence: 99%

Radiation-Tolerance Assessment of a Redundant Wireless Device

Huang

Jiang

2018

EPJ Web Conf.

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Abstract-This paper presents a method to evaluate radiationtolerance without physical tests for a commercial off-the-shelf (COTS)-based monitoring device for high level radiation fields, such as those found in post-accident conditions in a nuclear power plant (NPP). This paper specifically describes the analysis of radiation environment in a severe accident, radiation damages in electronics, and the redundant solution used to prolong the life of the system, as well as the evaluation method for radiation protection and the analysis method of system reliability. As a case study, a wireless monitoring device with redundant and diversified channels is evaluated by using the developed method. The study results and system assessment data show that, under the given radiation condition, performance of the redundant device is more reliable and more robust than those nonredundant devices. The developed redundant wireless monitoring device is therefore able to apply in those conditions (up to 10 M Rad (Si)) during a severe accident in a NPP.

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Fault Simulation and Emulation Tools to Augment Radiation-Hardness Assurance Testing

Cited by 76 publications

References 136 publications

Efficient Mitigation of Data and Control Flow Errors in Microprocessors

Efficient Mitigation of Data and Control Flow Errors in Microprocessors

A Methodology to Emulate Single Event Upsets in Flip-Flops Using FPGAs through Partial Reconfiguration and Instrumentation

Radiation-Tolerance Assessment of a Redundant Wireless Device

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