Fault tolerant memory design for HW/SW co-reliability in massively parallel computing systems

Choi, Minsu; Park, N.-J.; George, K. E.; Jin, B.; Park, N.; Kim, Y.B.; Lombardi, Fabrizio

doi:10.1109/nca.2003.1201173

Cited by 1 publication

(1 citation statement)

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“…Reliability in memories takes essentially two forms: to protect against SEUs, the use or redundant ECC bits associated with each memory word is common and well-advertised [39], while marginally less known is the use of spare memory locations to replace permanently damaged ones. The latter technique, used extensively at fabrication for laser-based permanent reconfiguration, has also been applied in an on-line self-repair setting [16].…”

Section: Memoriesmentioning

confidence: 99%

Resilience within Ultrascale Computing System: Challenges and Opportunities from Nesus Project

Bouvry

Mayer

Muszynski

et al. 2015

JSFI

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Although resilience is already an established field in system science and many methodologies and approaches are available to deal with it, the unprecedented scales of computing, of the massive data to be managed, new network technologies, and drastically new forms of massive scale applications bring new challenges that need to be addressed. This paper reviews the challenges and approaches of resilience in ultrascale computing systems from multiple perspectives involving and addressing the resilience aspects of hardware-software co-design for ultrascale systems, resilience against (security) attacks, new approaches and methodologies to resilience in ultrascale systems, applications and case studies.

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Section: Memoriesmentioning

confidence: 99%