Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412)
DOI: 10.1109/imtc.2003.1208117
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Feature selection for defect classification in machine condition monitoring

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Cited by 3 publications
(2 citation statements)
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“…On the other hand, more features may bring in useless information or even misleading information. Malhi and Gao [17] have shown that some features provide contradictory information and thus decrease the quality of data analysis. Also, in real time stress detection more features mean more data processing, which may reduce or limit the real time performance.…”
Section: Introductionmentioning
confidence: 99%
“…On the other hand, more features may bring in useless information or even misleading information. Malhi and Gao [17] have shown that some features provide contradictory information and thus decrease the quality of data analysis. Also, in real time stress detection more features mean more data processing, which may reduce or limit the real time performance.…”
Section: Introductionmentioning
confidence: 99%
“…Extracting the fault characterized information from the vibration signal is crucial to the fault diagnosis. Various techniques such as statistic parameters, FFT, wavelet transform, EMD, AR model and ANN have been applied to extract useful features successfully [1][2][3][4][5].…”
Section: Introductionmentioning
confidence: 99%