Radial shearing interferometer (RSI) is one of the most powerful tools in many domains, especially in optical testing. RSI has compact size and good vibration immunity, which is adaptive to various environments, due to its common-path configuration. Moreover, it is very convenient application because no plane referencing wavefront is needed. The disadvantages of the conventional RSIs are that the distorted wavefront is hard to extract quickly and accurately from one radial shearography due to the phase extract algorithm is complex. Fortunately, the new RSIs can receive benefits from the accuracy of the methods of phase-shifting interferometry, and phase-shifting shearography is more sensitive than simple digital shearography. There are two mainly trend to the RSIs based on phase-shifting technique, i.e. instantaneous phase-shifting and compact size. In this chapter, a development process of RSI will be introduced briefly firstly, and then the some new RSIs based phase-shifting techniques in our work will be described in following parts, including initial RSI by using four-step polarization phase-shifting, modal wavefront reconstruction method for RSI with lateral shear and a new kind of compact RSI based micro-optics technique.