2014
DOI: 10.1016/j.mspro.2014.06.014
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FEM Study of Fatigue Crack Growth in a Power Semiconductor Chip Subjected to Transient Thermal Loading

Abstract: A detailed finite element analysis of fatigue crack growth between metallisation layers of a power semiconductor device subjected to active cycling conditions is carried out. The active cycling and the resulting transient thermal loading is the source of the thermally-induced cyclic stresses in the microelectronic device, which may cause the fatigue failure. To model the fatigue crack formation and propagation under the transient thermal loading conditions, a coupled thermomechanical cyclic cohesive zone model… Show more

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Cited by 4 publications
(2 citation statements)
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“…The idea behind the cycle jump methods is based on a 2‐stage procedure, where, first, the rate of damage (or any other history variable) within a single load cycle is calculated and, then, this rate is used to extrapolate the evolution of the history variables for the subsequent cycles. () The last stage is also called a jump, hence the name “cycle jump methods”. The length of the jump is usually determined in an adaptive manner based on a change of the mentioned cyclic rates during the jumps.…”
Section: Introductionmentioning
confidence: 99%
“…The idea behind the cycle jump methods is based on a 2‐stage procedure, where, first, the rate of damage (or any other history variable) within a single load cycle is calculated and, then, this rate is used to extrapolate the evolution of the history variables for the subsequent cycles. () The last stage is also called a jump, hence the name “cycle jump methods”. The length of the jump is usually determined in an adaptive manner based on a change of the mentioned cyclic rates during the jumps.…”
Section: Introductionmentioning
confidence: 99%
“…The cycle jump methods first calculate the rate of damage (or any other history variable) of one cycle and use it then to extrapolate the evolution of the history variables for the subsequent cycles [Cojocaru et al 2006;Kravchenko et al 2014]. These omitted cycles are jumped over and explain the name of the method.…”
Section: Time Integration Of a Fatigue Modelmentioning
confidence: 99%