2001
DOI: 10.1103/physrevb.64.224417
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Fermi surface instability inCeRh2Si2under pressure

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Cited by 71 publications
(79 citation statements)
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“…A key problem is the FS evolution first at P=0 in the polarized paramagnetic state (PPM) state created above the metamagnetic field (H c ∼23T) and then inside this PPM state under pressure, notably for P > P c [37]. By comparison to YbRh 2 Si 2 where similar questions are under debate, CeRh 2 Si 2 is a quite more realistic experimental case since FS determinations have already been achieved inside the AF and PM phases at low field [25]. Unfortunately, this situation is unlikely to happen in YbRh 2 Si 2 due to the hudge value of the effective masses and the low value of the magnetic critical field (H ≃ 0.1T ) [27,38,39].…”
Section: Discussionmentioning
confidence: 99%
See 1 more Smart Citation
“…A key problem is the FS evolution first at P=0 in the polarized paramagnetic state (PPM) state created above the metamagnetic field (H c ∼23T) and then inside this PPM state under pressure, notably for P > P c [37]. By comparison to YbRh 2 Si 2 where similar questions are under debate, CeRh 2 Si 2 is a quite more realistic experimental case since FS determinations have already been achieved inside the AF and PM phases at low field [25]. Unfortunately, this situation is unlikely to happen in YbRh 2 Si 2 due to the hudge value of the effective masses and the low value of the magnetic critical field (H ≃ 0.1T ) [27,38,39].…”
Section: Discussionmentioning
confidence: 99%
“…The FS reconstruction switches from a FS analog to LaRh 2 Si 2 with a localized behavior of the 4f electron (P < P c ) to, in the PM phase (P > P c ), a FS where the 4f electrons are considered to be itinerant [25].…”
Section: Discussionmentioning
confidence: 99%
“…11(b). According to [49], at least one sheet of the Fermi surface of CeRh 2 Si 2 crosses the degeneracy surface or comes close to it.…”
Section: Cepd2si2 and Cerh2si2mentioning
confidence: 99%
“…Up to now, the CeRu 2 Si 2 series is the fingerprint example of these phenomena 2,3 . Here we present the effects of H an P on the thermoelectric power (TEP) of the compound CeRh 2 Si 2 with the aim to observe the response on a system where a FS instability under pressure is well established by previous de Haas van Alphen (dHvA) experiments [4][5][6] and where the magnetic structure of the AF phase has been fully determined 7 . Figure 1 represents the main features of the CeRh 2 Si 2 (H, T , P ) phase diagram as measured from our TEP.…”
Section: Introductionmentioning
confidence: 99%