2016
DOI: 10.5028/jatm.v8i3.653
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Ferrite Quantification Methodologies for Duplex Stainless Steel

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Cited by 32 publications
(15 citation statements)
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“…In comparison with the pattern of pure graphite which is dominated by an intense peak at 2 θ = 26.48° corresponding to reflection in (002) planes of well‐ordered graphene layers, a graphene peak (26.4°) can be attributed to a very small concentration of non‐oxidized graphene . According to the type of sample holder, the peak at 2 θ = 63° is attributed to the duplex stainless steel of the analytical apparatus (Figure a). Interestingly, the XRD pattern of the M‐GO hybrid indicated the presence of a similar crystalline structure of pure Fe 3 O 4 at 2 θ = 30.22°, 35.59°, 43.29°, 53.69° and 62.81° which indicated the structure of Fe 3 O 4 nanoparticles (Figure b).…”
Section: Resultsmentioning
confidence: 99%
“…In comparison with the pattern of pure graphite which is dominated by an intense peak at 2 θ = 26.48° corresponding to reflection in (002) planes of well‐ordered graphene layers, a graphene peak (26.4°) can be attributed to a very small concentration of non‐oxidized graphene . According to the type of sample holder, the peak at 2 θ = 63° is attributed to the duplex stainless steel of the analytical apparatus (Figure a). Interestingly, the XRD pattern of the M‐GO hybrid indicated the presence of a similar crystalline structure of pure Fe 3 O 4 at 2 θ = 30.22°, 35.59°, 43.29°, 53.69° and 62.81° which indicated the structure of Fe 3 O 4 nanoparticles (Figure b).…”
Section: Resultsmentioning
confidence: 99%
“…Austenite, ferrite and martensite are the most prominent phases in iron-based materials. Many different kinds of methods like diffraction (XRD, synchrotron/neutron diffraction), Bragg edge transmission (BET), magnetic balance measurements, image analysis (optical microscopy, EBSD) have been used for quantification of phase contents in iron-based materials over the last decades [1][2][3][4][5]. Image analysis depends crucially on the quality of sample preparation; it can provide fast phase quantification with accuracy of ± 2 vol.…”
Section: Introductionmentioning
confidence: 99%
“…In image analysis, the fraction of each phase is measured on etched samples in high magnification using a light optical microscope with special software. This is considered to be one of the most accurate techniques [15,16] and together with point counting, usually the only method accepted when developing welding procedure specifications. The precision, however, is dependent on the surface quality of the sample; scratches and limited etch quality are influencing the final result.…”
Section: Introductionmentioning
confidence: 99%