Ferroelectric 90° Domain Evaluation in Tetragonal Pb(Mg_1/3Nb_2/3)O₃–PbTiO₃ Ceramics

Abstract

The domain structure of ferroelectrics changes during poling has a direct influence on the macroscopic properties of the materials. The intensity variation of the different X‐ray diffraction (XRD) pattern profiles was used to identify the percentage of 90° domain reorientation in the tetragonal phase of Pb(Mg1/3Nb2/3)O3–PbTiO3 (PMN–PT) ceramics after poling. The results are consistent with the change of piezoelectric properties. In addition, by using XRD patterns, a spatial distribution of polarization in a well‐poled 0.62PMN–0.38PT ceramics has been determined and was found to be best described by the Cauchy function W00l (ϕ)=1/(1+0.023ϕ2).

Effects of Poling Process on KNN‐Modified Piezoceramic Properties

“…Because the 180° domain reversal does not affect the XRD intensities, the change of the I 200 / I 002 ratio only reflects the 90° domain reorientation during the poling process. The percentage of 90° domains reorientation, N , was calculated by 18 N =( R − R ′)/( R +2 R ′), where R and R ′ correspond to the I 002 / I 200 ratio obtained before and after poling, respectively. The obtained results and the piezoelectric properties are listed in Table I.…”

Ferroelectrics under the Synchrotron Light: A Review

“…X-ray diffraction (XRD) is a useful, yet complex, tool that has been extensively devoted to studying the evolution of the crystal structure of ferroelectrics under the action of an electric-field using conventional diffraction (CuKα radiation tubes) [20,21,22,23,24] and synchrotron radiation sources [25,26]. It must be noticed that poling and depoling of ferroelectric ceramics can be also achieved by the application of mechanical loads to the sample and there is also extended parallel literature that uses the same structure, strain and texture determination tools and models [27] as those used for the electrical poling, a review of which is outside the scope of this work.…”

“…As a consequence, there is a growth in the intensity of the peaks at the X-ray diffraction pattern corresponding to interplanar distances in parallel with the applied field at the expense of the decrease of others corresponding to interplanar distances perpendicular to the field. The volume of ferroelectric domain alignment can be calculated from the changes in the integrated intensities in the non-poled and poled samples of selected peaks of the diffraction pattern [13,20,21,23,24,25,26,27]. Deconvolution of degenerated peaks for the purpose of peak intensity calculation can be performed by a variety of software [36].…”

Complex Oxide Ferroelectric Ceramics Pb(Ni1/3Nb2/3)O3–Pb(Zn1/3Nb2/3)O3–Pb(Mg1/3Nb2/3)O3–PbZrO3–PbTiO3 with a Low Sintering Temperature

“…Haertling 6 reviewed that various PZT‐based compounds have a d 33 in the range of 200–600 pC/N depending on the types of dopants, while Zhang et al 30 also reported that 0.62PMN–0.38PT demonstrated a d 33 of 393 pC/N when sintered at 1150°C. Fan and Kim 26 fabricated 0.5PZN–0.5PZT with a d 33 of 430 pC/N when sintered at 1100°C.…”