2009
DOI: 10.1007/978-1-84882-507-9_5
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Ferroelectric Devices

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Cited by 5 publications
(1 citation statement)
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“…Oxygen vacancies are the most common in perovskites. 2 In agile microwave devices (i.e., varactors, film bulk acoustic wave resonators, FBARs) based on paraelectric phase ferroelectrics, the oxygen vacancies cause high RF and DC leakages currents, microwave losses, 3 and distortion (hysteresis) of C-V, 4,5 tand-V, 6 and I-V (Ref. 7) dependencies.…”
Section: Introduction: Negative Effects Of the Oxygen Vacancies Inmentioning
confidence: 99%
“…Oxygen vacancies are the most common in perovskites. 2 In agile microwave devices (i.e., varactors, film bulk acoustic wave resonators, FBARs) based on paraelectric phase ferroelectrics, the oxygen vacancies cause high RF and DC leakages currents, microwave losses, 3 and distortion (hysteresis) of C-V, 4,5 tand-V, 6 and I-V (Ref. 7) dependencies.…”
Section: Introduction: Negative Effects Of the Oxygen Vacancies Inmentioning
confidence: 99%