2005
DOI: 10.1063/1.2135891
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Ferroelectric properties of epitaxial BaTiO3 thin films and heterostructures on different substrates

Abstract: Ferroelectric thin films of BaTiO 3 and BaTiO 3 / SrRuO 3 epitaxial heterostructures on different single-crystalline substrates were fabricated by pulsed laser deposition. The BaTiO 3 films of 100-400 nm thickness show high structural perfection and c-axis-oriented growth. For the electrical characterization of the BaTiO 3 in a thin-film capacitor structure, Pt top electrodes were deposited by e-beam evaporation. The results are compared to the current experimental and theoretical models. Special consideration… Show more

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Cited by 70 publications
(47 citation statements)
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“…1a shows P-E hysteresis loops for the BTO100 film. The maximum polarization (P max ), saturation polarization (P s ), remanent polarization (P r ) and coercive field (E c ) values for the BTO100 film are 62.4 μC cm , respectively, with the applied electric field range of ± 500 kV cm −1 , which are comparable to those of epitaxial BTO films in the literatures [47][48][49][50]. Fig.…”
Section: Resultssupporting
confidence: 66%
“…1a shows P-E hysteresis loops for the BTO100 film. The maximum polarization (P max ), saturation polarization (P s ), remanent polarization (P r ) and coercive field (E c ) values for the BTO100 film are 62.4 μC cm , respectively, with the applied electric field range of ± 500 kV cm −1 , which are comparable to those of epitaxial BTO films in the literatures [47][48][49][50]. Fig.…”
Section: Resultssupporting
confidence: 66%
“…As an example, a typical variation of capacitance and dielectric losses is shown in Figure 1 for selected spot frequencies and for the whole temperature range for a sputtered Nb-doped BaTiO 3 film. In this figure, two anomalies are clearly evidenced at about 250 K and 50 K. We will first focus on the high temperature feature which was already reported in several papers 12,13 for BaTiO 3 films with different electrodes. The maximum in losses can be ascribed to a dielectric relaxation whose activation energy is computed from an Arrhenius law linking the operating frequency f to the related temperature T where the loss maximum occurs f = f 0 e −E/kT .…”
Section: Resultsmentioning
confidence: 98%
“…Nevertheless, improved control of interfaces in advanced ceramics may help using space charges in defected oxides for applications in integrated devices. 78 Such interfaces being of great influence in thin films and multilayers, the resulting space charges are clearly evidenced in perovskite multilayers 79,80 while polarons also induce a low temperature relaxation. 81 …”
Section: Discussionmentioning
confidence: 99%