2005
DOI: 10.1016/j.tsf.2004.06.115
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Ferroelectric properties of lanthanum-doped bismuth titanate thin films grown by a sol–gel method

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Cited by 59 publications
(25 citation statements)
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“…An increase in La contents resulted in a decrease in the grain size because the substituted La acts as a grain-growth inhibitor in the BLT films. 16) Additionally, surface holes were observed on the BLT films with x = 0, 0.25, and 0.50 while the surface of the BLT films with x = 0.75 and 1.00 was closely packed without surface holes. It was observed that La substitution (x = 0.75 and 1.00) to BIT film was effective to induce an improved microstructure of the BLT films without the formation of surface holes.…”
Section: Resultsmentioning
confidence: 89%
“…An increase in La contents resulted in a decrease in the grain size because the substituted La acts as a grain-growth inhibitor in the BLT films. 16) Additionally, surface holes were observed on the BLT films with x = 0, 0.25, and 0.50 while the surface of the BLT films with x = 0.75 and 1.00 was closely packed without surface holes. It was observed that La substitution (x = 0.75 and 1.00) to BIT film was effective to induce an improved microstructure of the BLT films without the formation of surface holes.…”
Section: Resultsmentioning
confidence: 89%
“…Although in our work, we applied the chemical solution deposition (CSD) method, it is interesting to compare our result with the work of Bae et al who present the ferroelectric properties of lanthanum-doped bismuth titanate thin films grown by a sol-gel method [8]. In their work, lanthanum-doped bismuth titanate, Bi 3.25 La 0.75 Ti 3 O 12 (BLT), and thin films were grown on Pt(1 1 1)/Ti/SiO 2 /Si (1 0 0) substrates by a sol-gel spin coating process.…”
Section: Effect Of Lanthanum Doping On Ferroelectric Host Materialsmentioning
confidence: 85%
“…16),17) This is simultaneously favored by the stabilization of the oxygen vacancies (V 00 O ). 23) To get insight into the effect of Pr 3+ substitution on the control of crystal growth, the degree of orientation ( f ) was determined as following Equation: 24) f ¼ IðhklÞ Ið006Þ þ Ið117Þ þ Ið200Þ ð1Þ…”
Section: Synthesis Of Bit and Bpt Powdermentioning
confidence: 99%