Abstract:Abstract. Magnetic properties of Co 2 MnSi thin films of 20 nm and 50 nm in thickness grown by radio frequency sputtering on a-plane sapphire substrates have been studied. X-ray diffraction (XRD) revealed that the cubic <110> Co 2 MnSi axis is normal to the substrate and that well defined preferential in-plane orientations are present. The static magnetic properties were studied at room temperature by conventional magneto-optical Kerr effect (MOKE), transverse bias initial inverse susceptibility and torque (TB… Show more
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