Ferromagnetism and Surface Chemical States of Ni_0.5Zn_0.5Fe₂O₄ Thin Film Grown on LaNiO₃ Bottom Layer Prepared by Chemical Solution Deposition

Abstract

Ni 0.5 Zn 0.5 Fe 2 O 4 (NZFO) thin films grown on LaNiO 3 (LNO) buffered Si (100) substrates were prepared by chemical solution deposition. The sample annealed rapidly at 600 • C in oxygen atmosphere. X-ray diffraction result showed that, the sample annealed in oxygen atmosphere is polycrystalline thin film. Field-emission scanning electron microscopy result revealed that the average grain size of the sample is about 20 nm. The magnetic measurement gave a typical value of the saturation magnetization of 0.767 emu/cm 3 . The chemical states and chemical composition of the film was also determined by X-ray photoelectron spectroscopy (XPS).