2023
DOI: 10.1002/admi.202202430
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FIB‐SEM and ToF‐SIMS Analysis of High‐Temperature PEM Fuel Cell Electrodes

Abstract: doped with PA. During cell activation, PA percolates from the membrane into the GDEs; thus, significantly enlarging the triple-phase boundary. While a high electrolyte content in the GDEs improves ionic conductivity, it inhibits reactant diffusion. The oxygen reduction reaction (ORR) on the cathode is particularly affected because oxygen diffusion is sluggish in phosphoric acid, and phosphate anion adsorption on the platinum catalyst blocks active sites. [1,2] Ideally, the PA should be distributed uniformly in… Show more

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Cited by 3 publications
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“…It is a necessity to develop concepts for depth-selective placement of functional molecules and to identify methods that allow unambiguous analysis of the modified materials as analysis of hybrid organic-inorganic nanoarchitectures owns a high potential for artefacts, especially when using sputter depth profiling [1]. It has been shown that combining FIB with ToF-SIMS analysis can be used for a proper surface analysis of organic materials, where a FIB is used as in-situ sputter technique [2]. More gentle approaches to depth-resolved chemical investigations were established, e.g., combining the production of a shallow FIB-cut (focused ion beam) by utilizing special sample holders and subsequent imaging of the crater bottom via ToF-SIMS [3].…”
Section: Introductionmentioning
confidence: 99%
“…It is a necessity to develop concepts for depth-selective placement of functional molecules and to identify methods that allow unambiguous analysis of the modified materials as analysis of hybrid organic-inorganic nanoarchitectures owns a high potential for artefacts, especially when using sputter depth profiling [1]. It has been shown that combining FIB with ToF-SIMS analysis can be used for a proper surface analysis of organic materials, where a FIB is used as in-situ sputter technique [2]. More gentle approaches to depth-resolved chemical investigations were established, e.g., combining the production of a shallow FIB-cut (focused ion beam) by utilizing special sample holders and subsequent imaging of the crater bottom via ToF-SIMS [3].…”
Section: Introductionmentioning
confidence: 99%