FIB/SEM Characterization of Carbon‐based Fibers

Abstract

The aim of this paper is to show how a focused ion beam combined with a scanning electron microscope (FIB/SEM machine) can be adopted to characterize composite fibers with different electrical behavior and to gain information about their production and modification. This comparative morphology investigation is carried out on polyacrylonitrile (PAN) carbon fibers and their chemical precursor (the oxidized PAN or oxypan) which has different electrical properties. Fibers are imaged by electron and ion beams and sectioned by the focused ion beam (FIB). A sample of oxypan fibers processed by a radio frequency (RF) plasma is also investigated and the role of the conductive carbon layer around their unmodified, insulating bulk is discussed. A suitable developed edge detection technique (EDT) on electron, ion images, and after the FIB sectioning, provides quantitative information about the thickness of the created layer.

Carbon Fiber Composite Targets for Nuclear Fusion Technology: A Focused Ion Beam/Scanning Electron Microscope Investigation

“…In this work, we have discussed how FIB/SEM techniques may be relevant in the understanding of interactions with carbon-based composite materials by mean of such a device (Milani et al . 2006b;Magni et al ., 2007). Samples of CFC armor mockups have been analyzed via FIB/SEM and EDX techniques to investigate the origins of the modifications induced by the plasma simulating ITER ELM-like conditions.…”

Creation of Controlled Defects Inside Colloidal Crystal Arrays with a Focused Ion Beam

“…[24,25] for further details). Holes drilled with the same recipe have been considered along with different images and the two different directions in order to have adequate statistics to calculate the mean value and the standard deviation, σ.…”

Alternative FIB TEM Sample Preparation Method for Cross-Sections of Thin Metal Films Deposited on Polymer Substrates

“…Cryo-FIB, although slower than microtomy, adds the benefit of being able to produce site-specific TEM samples of a cryogenically hardened sample. These cryogenics also help against sample heating problems, but require the needed cryogenic equipment and handling for the FIB and TEM (Thompson et al, 2006; Magni et al, 2007; Moon et al, 2007, 2009; Peterson, 2008; Kooi, 2008; Thangaduraii et al, 2008; Yogev et al, 2008; Floresca et al, 2009; Kim et al, 2011).…”