Fibroblast growth on patterned polymeric coatings

Genzel, Susanne; Sen-Richter, Aromita; Reich, Uta; Menzel, Henning; Reuter, G.; Lenarz, Thomas; Paasche, Gerrit

doi:10.1002/pssa.201532787

Cited by 4 publications

(6 citation statements)

References 24 publications

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“…The measured lattice spacing dðhkl; ; Þ and X-ray elastic strains "ðhkl; ; Þ represent volume-average quantities which depend on the actual stress depth profile ðzÞ, X-ray penetration depth , reflection hkl and experiment geometry. In general, dðhkl; ; Þ and "ðhkl; ; Þ can be related as follows (Dö lle & Hauk, 1979;Genzel, 1996):…”

Section: Introductionmentioning

confidence: 99%

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

et al. 2013

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Novel scanning synchrotron cross-sectional nanobeam and conventional laboratory as well as synchrotron Laplace X-ray diffraction methods are used to characterize residual stresses in exemplary 11.5 mm-thick TiN coatings. Both real and Laplace space approaches reveal a homogeneous tensile stress state and a very pronounced compressive stress gradient in as-deposited and blasted coatings, respectively. The unique capabilities of the cross-sectional approach operating with a beam size of 100 nm in diameter allow the analysis of stress variation with sub-micrometre resolution at arbitrary depths and the correlation of the stress evolution with the local coating microstructure. Finally, advantages and disadvantages of both approaches are extensively discussed.

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Section: Introductionmentioning

confidence: 99%

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

et al. 2013

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“…It should be mentioned that the idea of fitting used in this work is similar to that applied to the determination of secondorder plastic incompatibility stress, where an additional adjusting parameter was also used by Baczmań ski et al (1994( , 2009( ) and Wroń ski et al (2007. In the general case of a severely deformed sample containing not only stacking faults but also significant levels of anisotropic second-order plastic incompatibility stress, an additional term should be added to equation (10) (consequently, an additional parameter responsible for this stress must be adjusted in the fitting procedure).…”

Section: Influence Of Stacking Faults On Measured Lattice Parametersmentioning

confidence: 99%

“…(a) a single-reflection and single-wavelength method (only one reflection and one wavelength), in which the sample must be rotated so that is constant but the orientation of the scattering vector changes with respect to the sample (Genzel, 1994;van Acker et al, 1994;Genzel et al, 1999;Kumar et al, 2006;Erbacher et al, 2007);…”

Section: Introductionmentioning

confidence: 99%

Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing-incidence X-ray diffraction

et al. 2015

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International audienceMultireflection grazing-incidence X-ray diffraction (MGIXD) was used to determine the stress- and strain-free lattice parameter in the surface layer of mechanically treated (polished and ground) tungsten and austenitic steel. It was shown that reliable diffraction stress analysis is possible only when an appropriate grain interaction model is applied to an anisotropic sample. Therefore, verification of the X-ray stress factors (XSFs) was accomplished by measuring relative lattice strains during an in situ tensile test. The results obtained using the MGIXD and standard methods ( and geometries) show that the Reuss and free-surface grain interaction models agree with the experimental data. Moreover, a new interpretation of the MGIXD results was proposed and applied for the first time to measure the probability of stacking faults as a function of penetration depth for a polished and ground austenitic sample. The XSF models verified in the tensile test were used in the analysis of residual stress components

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“…The X-ray penetration depth varies with the sample orientation with respect to the incident and diffracted beams. This effect has been used within the sin 2 method to determine the residual stress depth profile from measurements realized at different angles with Laplace inverse transforms (Genzel, 1996;Marciszko et al, 2013). In our samples, the X-ray penetration Crystal lattice parameters (filled symbols) at the surface of a shot-peened sample and X-ray maximum penetration depth max (open symbols) as a function of the number of lattice planes chosen for the data analysis.…”

Section: Optimization and Practical Issuesmentioning

confidence: 99%

Residual stress determination in a shot-peened nickel-based single-crystal superalloy using X-ray diffraction

et al. 2015

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A residual stress depth profile up to 1 mm is determined with the Ortner method in a single crystal of a nickel-based superalloy which has been subjected to shotpeening. An optimization procedure is assessed to minimize uncertainties connected to Bragg angle, mosaic spread and numerical stability. The theoretical background is reviewed to highlight the connections between Bragg angle positions and the stress tensor components in different coordinate systems and also to obtain a mathematically consistent formulation. Transformation matrices required to express the strain components with respect to the initial state are provided for the general case. It is shown that, when a stress gradient occurs beneath the sample surface plane, the value of the 33 component of the stress tensor determined from measurements is twice its true value. For a sample surface oriented along a h100i crystallographic direction, the data analysis shows that the compressive stresses which develop in the 150 mm-thick surface layer are compensated for by small tensile stresses developing at long scale rather than a specific layer of finite size featuring high tensile stresses. At least 17 Bragg angles are required to have stable solutions with standard deviations close to 30 MPa. Maximum compressive stresses of 1000 or 1400 MPa depending on the assumption used to describe the initial state occur at a 30 mm depth.

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Fibroblast growth on patterned polymeric coatings

Cited by 4 publications

References 24 publications

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

X-ray analysis of residual stress gradients in TiN coatings by a Laplace space approach and cross-sectional nanodiffraction: a critical comparison

Problem of elastic anisotropy and stacking faults in stress analysis using multireflection grazing-incidence X-ray diffraction

Residual stress determination in a shot-peened nickel-based single-crystal superalloy using X-ray diffraction

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