2007
DOI: 10.1016/j.apsusc.2006.08.021
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Field-effect transistor based on a combination of nanometer film and undoped semiconductor

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“…The fluctuation in emission current for samples is within 2.6%. The electron emission stability is superior to the CNT [10] and a-C [11].…”
Section: Advanced Materials Research Vol 279mentioning
confidence: 94%
“…The fluctuation in emission current for samples is within 2.6%. The electron emission stability is superior to the CNT [10] and a-C [11].…”
Section: Advanced Materials Research Vol 279mentioning
confidence: 94%