2012
DOI: 10.1021/am301302b
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Field-Effect Transistors from Lithographically Patterned Cadmium Selenide Nanowire Arrays

Abstract: Field-effect transistors (NWFETs) have been prepared from arrays of polycrystalline cadmium selenide (pc-CdSe) nanowires using a back gate configuration. pc-CdSe nanowires were fabricated using the lithographically patterned nanowire electrodeposition (LPNE) process on SiO(2)/Si substrates. After electrodeposition, pc-CdSe nanowires were thermally annealed at 300 °C × 4 h either with or without exposure to CdCl(2) in methanol-a grain growth promoter. The influence of CdCl(2) treatment was to increase the mean … Show more

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Cited by 12 publications
(25 citation statements)
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References 62 publications
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“…The charge carrier concentration ( n e ) was calculated from the threshold voltage ( V th ) using eq and was found to be n e = (2.7 × 10 18 ) – (4.8 × 10 18 ) cm –3 . Both our μ and n e values are in the range of those reported for other CdSe nanowires. ,, Specifically, reported μ values range between 1.9 × 10 –4 cm 2 V –1 s –1 (ref ) and 0.77 cm 2 V –1 s –1 (ref ). These values are much smaller than that of bulk CdSe, μ = 650 cm 2 V –1 s –1 .…”
Section: Resultssupporting
confidence: 80%
See 1 more Smart Citation
“…The charge carrier concentration ( n e ) was calculated from the threshold voltage ( V th ) using eq and was found to be n e = (2.7 × 10 18 ) – (4.8 × 10 18 ) cm –3 . Both our μ and n e values are in the range of those reported for other CdSe nanowires. ,, Specifically, reported μ values range between 1.9 × 10 –4 cm 2 V –1 s –1 (ref ) and 0.77 cm 2 V –1 s –1 (ref ). These values are much smaller than that of bulk CdSe, μ = 650 cm 2 V –1 s –1 .…”
Section: Resultssupporting
confidence: 80%
“…Both our μ and n e values are in the range of those reported for other CdSe nanowires. 29 , 33 , 43 Specifically, reported μ values range between 1.9 × 10 –4 cm 2 V –1 s –1 (ref ( 43 )) and 0.77 cm 2 V –1 s –1 (ref ( 29 )). These values are much smaller than that of bulk CdSe, 44 μ = 650 cm 2 V –1 s –1 .…”
Section: Resultsmentioning
confidence: 99%
“…Five tn-ELJ with different w CdSe values, shown in Figure f–j, were investigated in this study. In recent prior work, ,, the properties of the nc-CdSe produced by an identical procedure were characterized by X-ray diffraction, Raman spectroscopy, and transmission electron microscopy. Electrodeposited nc-CdSe is crystalline, possesses a cubic crystal structure, and has a mean grain diameter of ≈5 nm. ,, …”
Section: Resultsmentioning
confidence: 99%
“…One possible mechanism accounting for a dead layer adjacent to metal contacts is the physical diffusion/migration of electrons and/or holes to these metal contacts and their subsequent radiationless recombination. In this case, the thickness of the dead layers should approximate the minority carrier diffusion length, estimated to be 30-50 nm based upon our prior measurements of carrier mobilities [2] and minority carrier lifetimes [25] in electrodeposited nc-CdSe. A second possibility, also suggested by others, [36] is that radiationless recombination near a contact is a symptom of poorer CdSe quality, in terms of impurities and crystallinity.…”
Section: Electroluminescence Spectra and Mechanismsmentioning
confidence: 99%
“…Because of their versatile physical characteristics and excellent one-dimensional structural properties, polymer nanowires (NWs) have attracted considerable attention as building blocks for important elements of integrated photonic and electronic devices, including photodetectors, optical waveguides, nanometer-scale lasers, light-emitting diodes, and field-effect transistors. Among these devices, nanoscale photodetectors that convert optical signals to electrical signals on the nanometer scale have aroused great interest as key functional components for on-chip information communication and processing.…”
mentioning
confidence: 99%