Field Evaporation and Related Topics

Miller, M.K.; Forbes, Richard G.

doi:10.1007/978-1-4899-7430-3_3

Cited by 3 publications

(6 citation statements)

References 160 publications

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“…Within this work the local evaporation rate is taken to be an Arrhenius' law depending on the local electric field strength [24]. However, the framework proposed is highly flexible and allows for very general sample evaporation functions, not explored in the context of this work.…”

Section: The Physics Of Field Evaporationmentioning

confidence: 99%

“…Here, A is a global constant relating the field evaporation emission equation [23,24] to the continuum theory, β is a temperature dependent parameter, F 0 (s) is the local material evaporation field, ||E(s)|| is the local electric field strength, and s is a point on the sample surface S. Whilst this law is of a simplified form to what is typically described within the literature [23], more complex formulations can be used without alterations to the model framework. Typical exper imental values for β approximately range from 40 (laser mode) to 400 (voltage mode).…”

Section: The Physics Of Field Evaporationmentioning

confidence: 99%

“…This potential averaging can be expressed as a matrix T f . The critical assumptions made in relating the BEM and FEM problems is given in equation (23), and the formulation of the FEM boundary integral in terms of q bem j is given in equation (24).…”

Section: Fem-bem Couplingmentioning

confidence: 99%

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Fast modelling of field evaporation in atom probe tomography using level set methods

Fletcher

Moody

Haley

2019

J. Phys. D: Appl. Phys.

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Current imaging algorithms in Atom Probe Tomography (APT) assume a simple geometric model for the trajectories of evaporated ions between the emitter and detector. Such point-projection approaches fail to incorporate changes in sample geometry due to different phase evaporation behaviour, leading to severe distortions in reconstructed APT data. Here we propose a new approach to APT reconstruction where a continuum model is used to account for changes in sample geometry. A 2D model is demonstrated, readily extendable to 3D, capable of simulating the complete evaporation of sample within minutes, while accounting for dielectric and crystallographic behaviour. Ion trajectories are calculated from the sample surface onto a simulated detector, allowing for the accurate mapping of detector positions onto the sample surface throughout time. Such an approach could drive a new reconstruction algorithm applicable to full size experimental datasets that can correct for the distortions currently present within APT reconstructions.

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Section: The Physics Of Field Evaporationmentioning

confidence: 99%

Section: The Physics Of Field Evaporationmentioning

confidence: 99%

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Fast modelling of field evaporation in atom probe tomography using level set methods

Fletcher

Moody

Haley

2019

J. Phys. D: Appl. Phys.

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“…At present, the model assumes individual phases are of a uniform evaporation field. Here the C term has been assumed constant, and assigned a typical value of 1.3 eV [13]. In this work, the temperature T has also been assumed constant over the surface (T = 50 K).…”

Section: The Continuum Evaporation Model: a Summarymentioning

confidence: 99%

“…Here, the authors propose formalising this concept of local surface magnification through the local Jacobian (J) of the trajectory mapping. In particular, a useful signed scalar magnification definition can be obtained from the local Jacobian determinant in equation (13). Here, a negative sign for ∥J∥ implies that the projected panel has flipped under the trajectory mapping (figure 5).…”

Section: Local Magnificationmentioning

confidence: 99%

Automated calibration of model-driven reconstructions in atom probe tomography

Fletcher

Moody

Fleischmann

et al. 2022

J. Phys. D: Appl. Phys.

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Traditional reconstruction protocols in atom probe tomography frequently feature image distortions for multiphase materials, due to inaccurate geometric assumptions regarding specimen evolution. In this work, the authors’ outline a new reconstruction protocol capable of correcting for many of these distortions. This new method uses predictions from a previously developed physical model for specimen field evaporation. The application of this new model-driven approach to both an experimental semiconductor multilayer system and a fin field-effect transistor device (finFET) is considered. In both systems, a significant reduction in multiphase image distortions when using this new algorithm is clearly demonstrated. By being able to quantitatively compare model predictions with experiment, such a method could also be applied to testing and validating new developments in field evaporation theory.

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High-Field Forming of Tungsten Surface by Evaporation in Liquid Nitrogen

Sadanov¹,

Mazilov²,

Gordienko³

et al. 2022

Problems of Atomic Science and Technology

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The basic obstacle to the application of the method of low-temperature field evaporation is the necessity of the creation of superhigh electric fields on the surface of the processing object. There are problems connected with the destruction of objects under the action of mechanical stress, generated by an electric field. In this contribution was shown that the phenomenon of high-field evaporation of metals in liquid nitrogen could be used for controlled forming of metal products with the sizes in a nanometer range used in modern nanotechnology. The evolution of microtopography was investigated by methods of field ion and electron microscopy and conventional methods of scanning electron microscopy. This contribution shows that as distinct from low-temperature evaporation in a high vacuum evaporation is observed here in a wide range of electric field strengths 4…57 V/nm. In the proposed treatment process the mechanical stress of the electric field falls as low as 20 kg/mm2. This value is less than the macroscopic strength by an order of magnitude.

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Field Evaporation and Related Topics

Cited by 3 publications

References 160 publications

Fast modelling of field evaporation in atom probe tomography using level set methods

Fast modelling of field evaporation in atom probe tomography using level set methods

Automated calibration of model-driven reconstructions in atom probe tomography

High-Field Forming of Tungsten Surface by Evaporation in Liquid Nitrogen

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