Field-Ion Microscopy in Materials Science

Wagner, Richard

doi:10.1007/978-3-642-68687-0_1

Cited by 13 publications

(7 citation statements)

References 178 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…In the cases to be discussed (see figures 12 to 16), this distance was adjusted such that the projected diameter of the probe hole is less than the diameter of a precipitate. A pulsed dissection process consists of applying a series of pulse voltages (Vp) on top of a steady-state imaging voltage (Vat), as this results in the dissection of a specimen on an atom-by-atom basis; pulsed field-evaporation is a highly controllable process that has been successfully employed to observe individual point defects-vacancies and self-interstitial atoms-in the bulk of specimens [40], as well as small precipitates in metal alloys [41][42][43][44][45]. As illustrated in figure 11, all the atoms in the cylinder of material with the diameter D are analyzed-that is, their mass-to-charge state ratios are determined-on an atom-by-atom basis.…”

Section: Atomprobe Field-ion Microscope Resultsmentioning

confidence: 99%

The chemical composition of a metal/ceramic interface on an atomic scale: The Cu/MgO {111} interface

1993

View full text Add to dashboard Cite

Keywords: Metal/ceramic interface, internal oxidation, Cu/MgO heterophase interface, high resolution electron microscopy, atom-probe field-ion microscopy.Abstract. The chemical composition profile across a Cu/MgO {lll}-type heterophase interface, produced by the internal oxidation of a Cu(Mg) single-phase alloy at 1173 K, is measured via atomprobe field-ion microscopy with a spatial resolution of 0.121 nm; this resolution is equal to the interplanar spacing of the {222) MgO planes. In particular, we demonstrate directly that the bonding across a Cu/MgO {lll}-type heterophase interface, along a <111> direction common to both the Cu matrix and an MgO precipitate, has the sequence CulOIMg... and not CulMglO... ; this result is achieved without any deconvolution of the experimental data. Before determining this chemical sequence, it was established, via high-resolution electron microscopy, that the morphology of an MgO precipitate in a Cu matrix is an octahedron faceted on {111} planes with a cube-on-cube relationship between a precipitate and the matrix; that is, {111}Cu//{222}MgO and < 110 >cu//< 110 >MgO.

show abstract

Section: Atomprobe Field-ion Microscope Resultsmentioning

confidence: 99%

The chemical composition of a metal/ceramic interface on an atomic scale: The Cu/MgO {111} interface

1993

View full text Add to dashboard Cite

show abstract

“…An integral profile is obtained by continuously applying a series of high-voltage pulses that results in the atom-by-atom dissection of individual atomic planes of a specimen; an individual plane of atoms is completely dissected and analyzed without interference from the atomic plane below it. This method and its physics are described in detail elsewhere [23][24][25][26][27]. The region along the central axis of a specimen is the last one to be internally oxidized as it is farthest from the surface of a cylindrically-shaped specimen.…”

Section: Methodsmentioning

confidence: 99%

Atomic scale studies of the mechanisms of internal oxidation

Jang¹,

Chan²,

Seidman

et al. 1993

Scripta Metallurgica et Materialia

View full text Add to dashboard Cite

“…This is an area that cannot be covered in this paper even in a superficial way. Fortunately, many excellent reviews already exist (Bowkett and Smith, 1970;Brenner, 1978;Ralph el al., 1982;Wagner, 1982;Brenner and Miller, 1983). Here, a random selection of examples will be briefly described.…”

Section: Some Applications Of the Atom Probementioning

confidence: 99%

Some aspects of field emission and field ion microscopy

Tsong

1985

J. Elec. Microsc. Tech.

View full text Add to dashboard Cite

KEY WORDS Field emission, Atom probe and field ion microscope, Behavior of single atoms, Single atom chemical analysis, Depth profiles ABSTRACTThe field emission microscope can reveal the work function variation of an emitter surface with a spatial resolution of -25 A. It is particularly powerful for studying adsorption-desorption and surface diffusion phenomena. The field ion microscope can resolve single atoms on solid surfaces. Structures of deeper surface layers can be revealed by field evaporation. The chemical identity of surface atoms can be analyzed one by one by time-offlight mass spectrometry in the atom probe. Using these two instruments, behavior of single atoms on metal surface, compositional variations in the surface layers of alloys, and the atomic structures as well as compositional variations of various phases in alloys and materials can be studied with true single atomic layer, spatial resolution. Some aspects of field emission techniques and applications of them to surface science and material characterization are described here.

show abstract

Field-Ion Microscopy in Materials Science

Cited by 13 publications

References 178 publications

The chemical composition of a metal/ceramic interface on an atomic scale: The Cu/MgO {111} interface

The chemical composition of a metal/ceramic interface on an atomic scale: The Cu/MgO {111} interface

Atomic scale studies of the mechanisms of internal oxidation

Some aspects of field emission and field ion microscopy

Contact Info

Product

Resources

About