Field Study of Photovoltaic Systems with Anti-Potential-Induced-Degradation Mechanism: UVF, EL, and Performance Ratio Investigations

Abstract

The potential-induced degradation (PID) of photovoltaic (PV) modules is one of the most extreme types of degradation in PV modules, where PID-affected modules can result in an almost 25% power reduction. Understanding how module defects impact PID is key to reducing the issue. Therefore, this work investigates the impact of an anti-PID inverter on PV modules throughout three years of field operating conditions. We used electroluminescence (EL), ultraviolet fluorescence (UVF), and thermography imaging to explore the varieties of an anti-PID inverter connected to a PV string. It was discovered that a PV string with an anti-PID inverter could improve the output power of the modules by 5.8%. In addition, the performance ratio (PR) was equal to 91.2% and 87.8%, respectively, for PV strings with and without an anti-PID inverter.

Understanding Photovoltaic Module Degradation: An Overview of Critical Factors, Models, and Reliability Enhancement Methods

“…Misalignments, cracks, and dirt produce hot spots seen via infrared, lowering Voc and Rsh [8][9][10][11][12][13][14][15][16][17][18][19][20][21][22][23][24][25]. Bypass diode failures from high voltage reverse bias generate visible burn marks, reducing Voc [15,16,26,33]. Junction box failures in c-Si and TF cells arise through attachment issues and corrosion [15][16][17][18][19][20][21][22][23][24][25][26].…”

“…Bypass diode failures from high voltage reverse bias generate visible burn marks, reducing Voc [15,16,26,33]. Junction box failures in c-Si and TF cells arise through attachment issues and corrosion [15][16][17][18][19][20][21][22][23][24][25][26].…”

“…Bubbles in PV modules caused by gas release reactions or moisture ingress lead to overheating and shorter cell lifetimes by interrupting heat dissipation . PID occurs in c-Si modules when voltage potential and resulting leakage currents degrade cells, requiring electroluminescence imaging and cutting Voc and FF [8,14,22,26,28,32,36]. LID in TF cells involves efficiency decline after sunlight exposure from defects in p-type silicon, necessitating Voc monitoring [14,21,26,27].…”

Prevention of potential‐induced degradation using a moisture barrier in crystalline silicon photovoltaic modules

“…29,[44][45][46] Lastly, installing an inverter at the system level can also prevent PID, but it requires the installation of additional electrical parts. 47,48 In this study, we developed a new method of preventing PID by applying a polytetrafluoroethylene (PTFE) moisture barrier onto the module glass. The use of PTFE as a moisture barrier is expected to prevent the leaching of Na and reduce the degradation of solar cells due to PID, contributing to the commercialization of more stable PV modules.…”

“…At the module level, using borosilicate or aluminosilicate glass instead of soda–lime glass with high sodium content can prevent PID, although it is an expensive option 29,44–46 . Lastly, installing an inverter at the system level can also prevent PID, but it requires the installation of additional electrical parts 47,48 . In this study, we developed a new method of preventing PID by applying a polytetrafluoroethylene (PTFE) moisture barrier onto the module glass.…”