2015
DOI: 10.3788/col201513.120501
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Filament diameter measurement system based on dual diffraction

Abstract: This Letter proposes a brand-new filament diameter measurement method based on what is called "dual diffraction," in that a grating is added behind the filament to make full use of its subdivision and amplification characteristics. Higher measurement accuracy is achieved by this method compared with the traditional diffraction method. To verify its accuracy, three standard filaments with nominal values of 100.2, 120.1, and 140.8 μm are measured by the dual diffraction method and traditional diffraction method … Show more

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Cited by 3 publications
(3 citation statements)
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“…Zhao et al used the two point sources projection method to correct the shaking amount of filament and achieve online measurement of filament diameter [15]. Yang et al proposed a novel method of measuring filament diameter based on dual diffraction, which added a grating behind the filament to make full use of its subdivision and amplification characteristics [16]. However, it can only measure filaments in the static state, and the method cannot be applied to dynamic filaments.…”
Section: Introductionmentioning
confidence: 99%
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“…Zhao et al used the two point sources projection method to correct the shaking amount of filament and achieve online measurement of filament diameter [15]. Yang et al proposed a novel method of measuring filament diameter based on dual diffraction, which added a grating behind the filament to make full use of its subdivision and amplification characteristics [16]. However, it can only measure filaments in the static state, and the method cannot be applied to dynamic filaments.…”
Section: Introductionmentioning
confidence: 99%
“…Meanwhile, the method is only used for the measurement of filaments in static state, and its effectiveness in dynamic measurement is not yet known [17]. In summary, non-contact inspection methods can be broadly divided into these types of photoelectric imaging measurement [10,11], scanning measurement [12,13], projection measurement [14,15] and diffraction measurement method [16,17]. Photoelectric imaging measurement method is greatly affected by light source and detector drift.…”
Section: Introductionmentioning
confidence: 99%
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