In 2D disordered superconductors prior to superconducting transition, the appearance of a resistance peak in the temperature dependent resistance [R(T)] measurements indicates the presence of weak localization (WL) & electron-electron interaction (EEI) in diffusion channel and superconducting fluctuations in the Cooper channel. Here, we demonstrate an interplay between superconducting fluctuations and electronelectron interaction by low temperature magnetotransport measurements for a set of 2D disordered TiN thin films. While cooling down the sample, a characteristic temperature T* is obtained from the R(T) at which superconducting fluctuations start to appear. The upturn in R(T) above T* corresponds to WL and/or EEI. By the temperature and field dependences of the observed resistance, we show that the upturn in R(T) originates mainly from EEI with a negligible contribution from WL. Further, we have used the modified Larkin's electron-electron attraction strength β(T/Tc), containing a field induced pair breaking parameter, in the Maki-Thompson (MT) superconducting fluctuation term. Here, the temperature dependence of the β(T/Tc) obtained from the magnetoresistance analysis shows a diverging behavior close to Tc and it remains almost constant at higher temperature within the limit of ln(T/Tc) <1. Interestingly, the variation of β(T/Tc) on the reduced temperature (T/Tc) offers a common trend which has been closely followed by all the concerned samples presented in this study. Finally, the temperature dependence of inverse phase scattering time (𝜏 𝜙 −1 ), as obtained from the magnetoresistance analysis, clearly shows two different regimes; the first one close to Tc follows the Ginzburg-Landau relaxation rate (𝜏 𝐺𝐿 −1 ), whereas, the second one at high temperature varies almost linearly with temperature indicating the dominance of inelastic electron-electron scattering for the dephasing mechanism. These two regimes are followed in a generic way by all the samples in spite of being grown under different growth conditions.