2015
DOI: 10.1007/s13391-015-4280-1
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Film thickness effect on fractality of tin-doped In2O3 thin films

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Cited by 45 publications
(26 citation statements)
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“…In certain situations the quality of the device can be improved by texturing. The processing and treatment of high-quality substrate are usually the first steps in preparation of heterostructures [18][19][20][21]. AFM is a source of 3D data about topography; by using it we can implement numerical evaluation of correlation areas, sizes of grains and holes, and the nature of their distribution.…”
Section: Resultsmentioning
confidence: 99%
“…In certain situations the quality of the device can be improved by texturing. The processing and treatment of high-quality substrate are usually the first steps in preparation of heterostructures [18][19][20][21]. AFM is a source of 3D data about topography; by using it we can implement numerical evaluation of correlation areas, sizes of grains and holes, and the nature of their distribution.…”
Section: Resultsmentioning
confidence: 99%
“…The role of 3‐D surface morphology of thin films is very important in the development of innovative micro/nanosystems with the discovery of novel materials, processes and phenomena on the micro/nanoscale for nanotechnology applications (Ramazanov, Ţălu, Sobola, Stach, & Ramazanov, ; Stach, Dallaeva, et al, ; Ţălu, Stach, Raoufi, & Hosseinpanahi, ; Ţălu, Stach, Valedbagi, Elahi, & Bavadi, ).…”
Section: Methodsmentioning
confidence: 99%
“…The scanning probe microscopy can be applied to various problems in a wide range of disciplines of the natural sciences, including solid-state physics, semiconductor science and technology [6][7][8], molecular engineering, polymer chemistry and physics [10,11], surface chemistry [12][13][14], surface science [15][16][17], molecular biology, cell biology [18], and biomedical sciences [9,10].…”
Section: Design Of Micro-courses In Microscopy Teachingmentioning
confidence: 99%
“…), trying scanning parameters (scanning rate [16], area, direction, etc. ); processing of the results: evaluation of spectroscopy data; estimation of the physical values (in case of electrical, mechanical, optical measurements), image processing and extraction quantitative data (statistical data, filtering, fractal analysis [12,14], etc.) SPM measurements should also provide insight to features and peculiarities of the other studies in nanometer and angstrom scale.…”
Section: Aims and Objectives Of Spm Teachingmentioning
confidence: 99%