1999
DOI: 10.1016/s0925-3467(99)00065-8
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Film thickness measurement and linear dichroism of organic thin films prepared by molecular beam deposition at oblique incidence

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Cited by 8 publications
(12 citation statements)
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“…Ellipsometer, the scratch-and-scan method implemented by a scanning-probe AFM was adopted to measure the film thickness [37,38,39]. The scratch-and-scan method includes the etching of a small area of the deposited film above the substrate.…”
Section: Film Thickness and Optical Propertiesmentioning
confidence: 99%
“…Ellipsometer, the scratch-and-scan method implemented by a scanning-probe AFM was adopted to measure the film thickness [37,38,39]. The scratch-and-scan method includes the etching of a small area of the deposited film above the substrate.…”
Section: Film Thickness and Optical Propertiesmentioning
confidence: 99%
“…11,165 For dipolar molecules, this phenomenon might not only result in a structural anisotropy but even in an alignment of the noncentrosymmetric species. [166][167][168][169][170][171] As a result, such organic thin films promise to open new frontiers for realizing linear and nonlinear optical devices.…”
Section: Molecular Beam Deposition Of Dipolar Organic Molecules At Obmentioning
confidence: 99%
“…4 A consequence of this are the rather high melting points of PEBA ͑300°C͒ and PVBA ͑350°C͒ measured by differential scanning calorimetry. 5 Hence, this class of materials is thermally very stable which is a prerequisite for any application.…”
Section: ͓S0003-6951͑99͒04221-7͔mentioning
confidence: 99%
“…The refractive indices for fundamental and second-harmonic light are found to be 1.75 and 1.82, respectively. 5 The dependence of the SHG intensity on the angle of incidence ⌰ ͓Fig. 3͑b͔͒ shows that d 333 has its maximum at ⌰ϭ0.…”
Section: ͓S0003-6951͑99͒04221-7͔mentioning
confidence: 99%
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