2017 IEEE 67th Electronic Components and Technology Conference (ECTC) 2017
DOI: 10.1109/ectc.2017.216
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Fine Pitch Cu Pillar with Bond on Lead (BOL) Assembly Challenges for Low Cost and High Performance Flip Chip Package

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Cited by 8 publications
(1 citation statement)
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“…Packaging technology has been developing towards high performance, low power consumption and high packaging density, such as POP, 2.5D packaging by interposer and 3D packaging [2][3][4]. The diameters of solder joints have been reduced from hundreds of microns to tens of microns [4,5]. There are many problems when using Sn alloys for interconnection, such as the short circuit caused by the overflow of melted Sn in the bonding process and the growth of Sn whisker [6,7], and the open circuit caused by Kirkendall voids [8].…”
Section: Introductionmentioning
confidence: 99%
“…Packaging technology has been developing towards high performance, low power consumption and high packaging density, such as POP, 2.5D packaging by interposer and 3D packaging [2][3][4]. The diameters of solder joints have been reduced from hundreds of microns to tens of microns [4,5]. There are many problems when using Sn alloys for interconnection, such as the short circuit caused by the overflow of melted Sn in the bonding process and the growth of Sn whisker [6,7], and the open circuit caused by Kirkendall voids [8].…”
Section: Introductionmentioning
confidence: 99%