2009
DOI: 10.1002/mop.24135
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Finite element analysis and experimental verification of SOI waveguide bending loss

Abstract: Bending and transition losses in silicon‐on‐insulator rib waveguides were calculated using finite‐element analysis of equivalent straight waveguides with perfectly matched boundary layers. Experimental loss measurements of silicon‐on‐insulator waveguides with various bend radii reveal that this technique accurately predicts loss and minimum bend radius for efficient design. © 2009 Wiley Periodicals, Inc. Microwave Opt Technol Lett 51: 699–702, 2009; Published online in Wiley InterScience (www.interscience.wile… Show more

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Cited by 3 publications
(2 citation statements)
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“…The grid size is set to be 10 times smaller than the dimensions of the corresponding regions and the maximum mesh element size is set to be 20 nm, such that accurate simulation results can be achieved within the allowed time and computational resources. Perfect matched layers (PMLs) were also added at the outer edges of the FEM simulation window to approximate an open geometry [ 28 ]. The PML was positioned 0.6 μm away from the waveguide edge.…”
Section: Performance Analysismentioning
confidence: 99%
“…The grid size is set to be 10 times smaller than the dimensions of the corresponding regions and the maximum mesh element size is set to be 20 nm, such that accurate simulation results can be achieved within the allowed time and computational resources. Perfect matched layers (PMLs) were also added at the outer edges of the FEM simulation window to approximate an open geometry [ 28 ]. The PML was positioned 0.6 μm away from the waveguide edge.…”
Section: Performance Analysismentioning
confidence: 99%
“…As the tangential vector finite element method (TVFEM) can cope with material discontinuities as well as sharp edges and corners in a natural way, it has been widely applied in the analysis of electromagnetic problems and has gained great success [1–4]. In the past few decades, the lowest order basis, i.e., Whitney basis [5], has been thoroughly investigated and widely used in the analysis of electromagnetic devices.…”
Section: Introductionmentioning
confidence: 99%