2021
DOI: 10.22214/ijraset.2021.35875
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Finite State Machine based Programmable Memory Built-in Self-Test

Abstract: We propose a methodology to design a Finite State Machine(FSM)-based Programmable Memory Built-In Self Test (PMBIST) which includes a planned procedure for Memory BIST which has a controller to select a test algorithm from a fixed set of algorithms that are built in the memory BIST. In general, it is not possible to test all the different memory modules present in System-on-Chip (SoC) with a single Test algorithm. Subsequently it is desirable to have a programmable Memory BIST controller which can execute mu… Show more

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